Publication Date:
2012-12-24
Description:
A special sequence of multilayer, consisting of PbZr 0.5 Ti 0.5 O 3 and SrTiO 3 films, was fabricated using a simple chemical solution deposition. X-ray diffractometer (XRD) measurement reveals that each film in this multilayer has been crystallized into the single perovskite phase. The high-angle annular dark-field scanning transmission electron microscopy (STEM) image shows that the obtained SrTiO 3 / PbZr 0.5 Ti 0.5 O 3 multilayer contains three components with different optical thicknesses: dense and porous PbZr 0.5 Ti 0.5 O 3 layers, together with dense SrTiO 3 layers. This multilayer system exhibits superior optical performance, with a peak reflectivity of∼95% and a bandwidth of ∼113 nm, rendering its promising candidate as dielectric mirrors, optical cavities, and selective filters.
Print ISSN:
0002-7820
Electronic ISSN:
1551-2916
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
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