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  • 1
    Electronic Resource
    Electronic Resource
    Dislocation contrast in X-ray synchrotron topographs (1977)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 10 (1977), S. 281-286 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: The contrast of dislocations in X-ray topographs taken in the Guinier–Tennevin mode with synchrotron radiation has been studied. In reflections where high orders were insignificant, dislocation images appeared very similar to those in Lang topographs taken with characteristic radiation. At large specimen-to-plate distances orientation contrast is important in the direct image. The sense of the Burgers vector of dislocations showing double contrast can be deduced.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889877013491
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  • 2
    Electronic Resource
    Electronic Resource
    Simulation of X-ray double-crystal rocking curves at multiple and inhomogeneous heteroepitaxial layers (1985)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 18 (1985), S. 446-451 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: Synchrotron radiation has been used to obtain double-crystal X-ray rocking curves from inhomogeneous layers of GaInAs on InP at a range of wavelengths. The consistency of the lattice-parameter profiles deduced by simulating the rocking curves using the Takagi–Taupin equations is shown to be good. The computational method has been extended to calculate the rocking curves from relatively thick multilayer structures of GaAlAs on GaAs grown by molecular beam epitaxy. This dynamical-theory approach permits the prediction of positions, heights and widths of major and satellite peaks. Results are in excellent agreement with experimental measurements, and by comparing experimental and calculated profiles the structural parameters of the layer can be deduced. The dynamical theory is particularly suitable for calculating the complete rocking curve especially where thick confining layers are present and the computational model is directly applicable to multi-layers with varying layer thicknesses.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S002188988501069X
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  • 3
    Electronic Resource
    Electronic Resource
    Dislocation images in X-ray section topographs of curved crystals (1991)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 24 (1991), S. 304-311 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: The contrast of dislocation images in X-ray section topographs of curved crystals has been investigated both experimentally and by computer simulation. Good agreement is found between experiment and simulation in both symmetric and asymmetric Laue geometries. Very little change is observed in the symmetric Laue images for radii of curvature as small as 18 m. In the asymmetric geometry, the background intensity rises and the Kato fringe visibility decreases as the curvature increases. The dynamical image becomes more localized and dominates the image as the direct image visibility falls. Our results explain the reversal of dislocation contrast in Lang projection topographs of curved crystals taken in asymmetric geometry.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889891001619
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  • 4
    Electronic Resource
    Electronic Resource
    X-ray topographic studies of dislocation contrast in silicon after boron diffusion (1973)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 6 (1973), S. 31-38 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: The contrast of dislocations generated by boron diffusion in silicon is studied in detail. The anomalously narrow images observed from an array of emitter-edge dislocations are explained by considering the effect of the strain fields of neighbouring dislocations. Interactions between emitter-edge dislocations and dislocations inside the diffused region are described and a mechanism suggested. The existence of strong contrast from pure-edge dislocations when both g. b = 0 and g. b ∧ u = 0 leads to the conclusion that the emitter-edge dislocations are heavily decorated by precipitate. Burgers vector analysis of the dislocations inside the diffused region supports previous work on phosphorus-diffused silicon, and indicates that reactions have occurred between these dislocations. The unusual contrast of these dislocations is interpreted using Penning–Polder theory when surface effects are taken into account. Asymmetric reflection `area contrast' is observed from the diffused region.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889873008010
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  • 5
    Electronic Resource
    Electronic Resource
    Cryogenic X-ray topography using synchrotron radiation (1977)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 10 (1977), S. 91-99 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: The application of synchrotron radiation to low-temperature X-ray topographic studies of magnetic materials is described. Details of four successful cryostat designs are presented. It is demonstrated that because of the peculiar properties of synchrotron radiation, X-ray topography at liquid-nitrogen temperature is extremely easy and work down to liquid-helium temperature straightforward. In addition the specimen may be surrounded by other apparatus, in this case an electromagnet, without appreciable loss of resolution. Topographs of antiferromagnetic domains in KNiF3 and KCoF3 are presented, and the first observations by X-ray topography of ferromagnetic domains in a rare-earth metal (terbium) and Jahn–Teller domains in DyVO4 are reported.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889877012977
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  • 6
    Electronic Resource
    Electronic Resource
    X-ray topographic study of dislocation around indents on {111} surfaces of indium antimonide (1987)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 20 (1987), S. 499-504 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: The dislocation configurations around microindentations on {111} surfaces of InSb have been studied by transmission X-ray topography. In all cases, glide on the B-type {111} planes only occurs. The most extended dislocation loops occur around A-surface indents. Glide occurs on inclined {111} planes and the loops have extended screw segments parallel to the surface. Around B-surface indents dislocations glide predominantly on the ({\bar 1} {\bar 1} {\bar 1}) plane parallel to the surface. The mobility of these dislocations is about two or three times less than the former type. Direct evidence for the formation of edge dislocation barriers from reactions between dislocations gliding in the ({\bar 1} {\bar 1} {\bar 1}) plane is presented.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S002188988708614X
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  • 7
    Electronic Resource
    Electronic Resource
    Ferroelastic domain structures and phase transitions in barium sodium niobate (1988)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 21 (1988), S. 145-150 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: Ferroelastic domains in barium sodium niobate (Ba2NaNb5O15) have been studied by X-ray Lang and white-beam synchrotron-radiation topography. In Lang topographs contrast was observed from domain walls and the domains themselves, the latter being due to anomalous dispersion. Most ferroelastic domain boundaries lay on (110) or (1{\bar 1}0) planes. The contrast from the ferroelastic domain walls suggests that displacements exist within the walls, probably due to walls zigzagging between {110} planes. As the temperature was raised, significant changes occurred in the domain configuration, and a single-domain state was formed at 559 K, well below the orthorhombic-to-tetragonal phase transition at 573 K. No evidence for an incommensurate phase or an associated domain structure could be found in the samples studied.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889887010471
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  • 8
    Electronic Resource
    Electronic Resource
    A Method for the Accurate Comparison of Lattice Parameters (1995)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 28 (1995), S. 753-760 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: A new method of comparison of lattice parameters is described. The method uses a standard double-crystal diffractometer, fitted with a specimen rotation stage, which compensates for tilt errors on the specimen setting. Some improvement is possible through the use of a monochromatizing system with a well defined wavelength. The use of a single reference standard enables the instrument zero to be accurately determined; the use of a second reference or a different reflection from the first allows the wavelength to be accurately determined. The errors are carefully assessed and it is shown that some errors important in other methods are self-cancelling through the use of the rotation stage, which need not itself be an ultraprecision component. Peak location to a confidence level of 10′′ permits absolute traceable lattice parameter determination to a few tens of parts in 106, with much greater relative sensitivity. The method is verified using both a tangent-arm-driven and direct-drive double-axis diffractometer at room temperature on samples of semi-insulating gallium arsenide. Comparison of the lattice parameter of a sample using this method and the conventional Bond technique is satisfactory.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889895006297
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  • 9
    Electronic Resource
    Electronic Resource
    An assessment of diamond turning for the production of silicon X-ray optical elements (1984)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 17 (1984), S. 111-117 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: A number of high-perfection single-crystal silicon specimens have been diamond turned under various conditions. Surface roughness was assessed visually and with a Talysurf 5 machine and lattice perfection monitored by double-axis X-ray diffractometry. No significant variation in roughness was found with turning speed and the flatness was approximately 0.1 μm. An increase of integrated intensity and full width at half maximum of the X-ray rocking curve of up to a factor of nine was observed. Most of this damage was shown to be confined to within the first few micrometers from the surface. It is concluded that diamond turning is a viable technique for the fabrication of a range of intricately figured X-ray optical elements including mirrors and high-energy-resolution monochromators, and also medium-band-pass high-intensity-beam conditioners where only one Bragg reflection is used. It is also concluded that X-ray diffractometry is a powerful technique for the investigation of the material damage in advanced machining processes.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889884011080
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  • 10
    Electronic Resource
    Electronic Resource
    Application of X-ray synchrotron topography to in situ studies of recrystallization (1978)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 11 (1978), S. 40-43 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: It is demonstrated that X-ray topography with synchrotron radiation provides an excellent means of simultaneously measuring the size and orientation of grains in polycrystalline materials. The technique, which also provides data on the lattice strains, is particularly suited to studies of grain growth at high temperatures and preliminary studies of recrystallization in iron-silicon alloy sheet are reported. The initial radial-growth rate is constant and approximately equal for all grains studied in one recrystallization.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889878012649
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