Publication Date:
2014-06-27
Description:
Author(s): Kensaku Chida, Tokuro Hata, Tomonori Arakawa, Sadashige Matsuo, Yoshitaka Nishihara, Takahiro Tanaka, Teruo Ono, and Kensuke Kobayashi We have measured the current noise in a device with Corbino geometry to investigate the dynamics of electrons in the breakdown regime of the integer quantum Hall effect (QHE). In the breakdown regime, the Fano factor of the current noise exceeds 103, which indicates the presence of electron bunching... [Phys. Rev. B 89, 235318] Published Thu Jun 26, 2014
Keywords:
Semiconductors II: surfaces, interfaces, microstructures, and related topics
Print ISSN:
1098-0121
Electronic ISSN:
1095-3795
Topics:
Physics
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