Publication Date:
2018-01-09
Description:
Author(s): F. Pfaff, H. Fujiwara, G. Berner, A. Yamasaki, H. Niwa, H. Kiuchi, A. Gloskovskii, W. Drube, J. Gabel, O. Kirilmaz, A. Sekiyama, J. Miyawaki, Y. Harada, S. Suga, M. Sing, and R. Claessen We present a detailed study of the Ti 3 d carriers at the interface of LaAlO 3 / SrTiO 3 heterostructures by high-resolution resonant inelastic soft x-ray scattering (RIXS), with special focus on the roles of overlayer thickness and oxygen vacancies. Our measurements show the existence of interfacial Ti ... [Phys. Rev. B 97, 035110] Published Mon Jan 08, 2018
Keywords:
Electronic structure and strongly correlated systems
Print ISSN:
1098-0121
Electronic ISSN:
1095-3795
Topics:
Physics
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