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  • 1
    Electronic Resource
    Electronic Resource
    Springer
    Applied physics 60 (1995), S. 229-232 
    ISSN: 1432-0649
    Keywords: 03.75.B ; 03.75.D ; 42.50.V
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract We present a time-resolved experimental observation of the diffraction of metastable helium atoms from a nearly resonant standing light wave. The application of a time-resolved detection technique and a pulsed source allows to resolve high diffraction orders, which are populated in the atom-light interaction. Furthermore, the rms momentum transfer from the light field on the atom as a function of the interaction time is investigated. Future applications of this technique may be the detailed investigation of the motion of atoms in standing light waves and the detection of correlations between spontaneously emitted photons and atoms.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Springer
    Applied physics 54 (1992), S. 375-379 
    ISSN: 1432-0649
    Keywords: 32.80.−t ; 42.50.Vk ; 07.77.+P
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract A novel atomic lens scheme is reported. A cylindrical lens potential was created by a large period (⋍ 45 μm) standing light wave perpendicular to a beam of metastable He atoms. The lens aperture (25 μm) was centered in one antinode of the standing wave; the laser frequency was nearly resonant with the atomic transition 23 S 1−23 P 2 (λ=1.083 μm) and the interaction time was significantly shorter than the spontaneous lifetime (100 ns) of the excited state. The thickness of the lens was given by the laser beam waist (40 μm) in the direction of the atomic beam. Preliminary results are presented, where an atomic beam is focused down to a spot size of 4 μm. Also, a microfabricated grating with a period of 8 μm was imaged. We discuss the principle limitations of the spatial resolution of the lens given by spherical and chromatic aberrations as well as by diffraction. The fact that this lens is very thin offers new perspectives for deep focusing into the nm range.
    Type of Medium: Electronic Resource
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