Publication Date:
2016-08-11
Description:
Author(s): Martin Linck, Peter Hartel, Stephan Uhlemann, Frank Kahl, Heiko Müller, Joachim Zach, Max. Haider, Marcel Niestadt, Maarten Bischoff, Johannes Biskupek, Zhongbo Lee, Tibor Lehnert, Felix Börrnert, Harald Rose, and Ute Kaiser Atomic resolution in transmission electron microscopy of thin and light-atom materials requires a rigorous reduction of the beam energy to reduce knockon damage. However, at the same time, the chromatic aberration deteriorates the resolution of the TEM image dramatically. Within the framework of the… [Phys. Rev. Lett. 117, 076101] Published Tue Aug 09, 2016
Keywords:
Condensed Matter: Structure, etc.
Print ISSN:
0031-9007
Electronic ISSN:
1079-7114
Topics:
Physics
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