Publication Date:
2018-08-25
Description:
Author(s): R. Steinacher, C. Pöltl, T. Krähenmann, A. Hofmann, C. Reichl, W. Zwerger, W. Wegscheider, R. A. Jalabert, K. Ensslin, D. Weinmann, and T. Ihn One of the fundamental aims of scanning gate microscopy is to measure local properties of high-mobility two-dimensional electronic systems. Here, the authors present a study which sheds light on the invasiveness of the scanning probe. The two-dimensional system is shaped into a ballistic cavity, which progressively concentrates the local density of states in order to study the transition from weakly to strongly invasive measurements. A good agreement between experiment and theory allows for the identification of the imaging mechanisms according to the strength of the tip potential. The insights gained lead to a deeper understanding of weakly invasive scanning gate imaging. [Phys. Rev. B 98, 075426] Published Fri Aug 24, 2018
Keywords:
Surface physics, nanoscale physics, low-dimensional systems
Print ISSN:
1098-0121
Electronic ISSN:
1095-3795
Topics:
Physics
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