Publication Date:
2014-06-24
Description:
Author(s): G. Shibata, K. Yoshimatsu, E. Sakai, V. R. Singh, V. K. Verma, K. Ishigami, T. Harano, T. Kadono, Y. Takeda, T. Okane, Y. Saitoh, H. Yamagami, A. Sawa, H. Kumigashira, M. Oshima, T. Koide, and A. Fujimori Metallic transition-metal oxides undergo a metal-to-insulator transition (MIT) as the film thickness decreases across a critical thickness of several monolayers (MLs), but its driving mechanism remains controversial. We have studied the thickness-dependent MIT of the ferromagnetic metal La0.6Sr0.4Mn... [Phys. Rev. B 89, 235123] Published Mon Jun 23, 2014
Keywords:
Electronic structure and strongly correlated systems
Print ISSN:
1098-0121
Electronic ISSN:
1095-3795
Topics:
Physics
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