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Thickness-dependent ferromagnetic metal to paramagnetic insulator transition in La0.6Sr0.4MnO3 thin films studied by x-ray magnetic circular dichroism (2014)

G. Shibata, K. Yoshimatsu, E. Sakai, V. R. Singh, V. K. Verma, K. Ishigami, T. Harano, T. Kadono, Y. Takeda, T. Okane, Y. Saitoh, H. Yamagami, A. Sawa, H. Kumigashira, M. Oshima, T. Koide, and A. Fujimori

American Physical Society (APS)

In: Physical Review B

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Publication Date: 2014-06-24

Description: Author(s): G. Shibata, K. Yoshimatsu, E. Sakai, V. R. Singh, V. K. Verma, K. Ishigami, T. Harano, T. Kadono, Y. Takeda, T. Okane, Y. Saitoh, H. Yamagami, A. Sawa, H. Kumigashira, M. Oshima, T. Koide, and A. Fujimori Metallic transition-metal oxides undergo a metal-to-insulator transition (MIT) as the film thickness decreases across a critical thickness of several monolayers (MLs), but its driving mechanism remains controversial. We have studied the thickness-dependent MIT of the ferromagnetic metal La0.6Sr0.4Mn... [Phys. Rev. B 89, 235123] Published Mon Jun 23, 2014

Keywords: Electronic structure and strongly correlated systems

Print ISSN: 1098-0121

Electronic ISSN: 1095-3795

Topics: Physics

Published by American Physical Society (APS)

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