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  • American Institute of Physics (AIP)  (1)
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    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 79 (1996), S. 5670-5670 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: This paper describes a simple and convenient simulation method, which uses analytical models for mark and beam patterns. The readout signal of optical disk system is obtained by two-dimensional convolution of Gaussian intensity beam pattern and elliptical mark pattern. Then, signal spectrum is obtained by executing a fast Fourier transform algorithm after adding quantitative MO noise sources within bandwidth. For simulation, the two-dimensional distributions of mark reflectivity and beam intensity were digitized, which enabled us to use easily available algorithm routines in digital signal processing. The resolution of the beam and mark patterns can easily be adjusted by changing the number of bits representing the patterns. Also, various noise sources in the MO disk system can be selectively added using random function generator. Simulated signal spectra were compared with experimental results. The parameters used were as follows: laser beam width was 780 nm, NA was 0.55, signal frequency was 9.4 MHz, duty ratio was 38%, and minimum mark dimension was 0.6 μm by 0.75 μm. Simulated C/N ratio was 50 dB, which was very close to the experimental value of 52 dB. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
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