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  • American Institute of Physics (AIP)  (2)
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  • 1
    Electronic Resource
    Electronic Resource
    High precision Wölter optic calibration facility : Proceedings of the tenth topical conference on high temperature plasma diagnostics (1995)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 66 (1995), S. 700-702 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We have developed an off-line facility for very precise characterization of the reflectance and spatial resolution of the grazing incidence Wölter type I x-ray optics used at Nova. The primary component of the facility is a new, very versatile, high brightness x-ray source consisting of a focused DC electron beam incident onto a precision manipulated target-pinhole array. The data are recorded with a selection of detectors. For imaging measurements we use direct exposure x-ray film modules or an x-ray charge-coupled device camera. For energy-resolved reflectance measurements, we use lithium drifted silicon detectors and a proportional counter. An in situ laser alignment system allows precise location and rapid periodic alignment verification of the x-ray point source, the statically mounted Wölter optic, and the chosen detector. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1146262
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  • 2
    Electronic Resource
    Electronic Resource
    Wölter x-ray microscope characterization facility (abstract) : Proceedings of the 9th topical conference on high temperature plasma diagnostics (1992)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 63 (1992), S. 5079-5079 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The capability for making ongoing characterization measurements of the spatial resolution and spectral reflectance of the Wölter x-ray optics used at Nova is essential for the interpretation of data taken with these imaging diagnostics. Equally important is an assessment of the long-term performance of grazing incidence x-ray optics used in the harsh environment of an ICF target chamber. We have designed and are currently building an off-line facility for such a characterization. The facility will consist of an x-ray source with specially designed pinhole-target foil array, the Wölter optics housing, monitoring and measuring detectors, a data acquisition system, and an in situ alignment system for rapid periodical verification. Each component of this lab will be discussed, along with possible initial results. This work was performed under the auspices of the U. S. Department of Energy by the Lawrence Livermore National Laboratory under contract No. W-7405-ENG-48.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1143497
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