Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Journal of Applied Physics
87 (2000), S. 4981-4983
ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
The properties of thick BaScxFe12−xO19 (0.3〈x〈0.6) scandium hexaferrite films were measured by static and microwave field techniques. Films were deposited by pulsed laser ablation onto c-plane sapphire at oxygen pressures of 20 and 50 mTorr. Vibrating sample magnetometer measurements as corroborated by x-ray data showed that the films below 3 μm had easy axis of magnetization (c-axis) normal to the film plane with saturation magnetization values of 3.0–3.8 kG. From the ferrimagnetic resonance frequency versus external magnetic field, we deduced a g value of 1.96±0.03 and uniaxial anisotropy field of ∼10 kOe. The ferrimagnetic resonance linewidth for the film thicker than 5 μm was maximum at 32 GHz and decreased with increasing frequency, indicating evidence for nonuniform magnetic field scattering internally. However, the linewidths were lower for films having thickness below 3 μm. © 2000 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.373222
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