Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Journal of Applied Physics
63 (1988), S. 3805-3807
ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
Ferromagnetic resonance (FMR) measurements have been performed on thin films of Fe80−xNixB15 Si5 alloys (x=5, 40, and 60). The effective magnetization (4πMeff ), magnetic anisotropy field (HA), and g factor were measured. The values of g for all the films ranged between 1.90〈g〈2.11. Spin-wave resonance (SWR) excitations were observed for H, the magnetic field, applied perpendicular to the film plane. SWR fields were found to obey the n2 law and yielded exchange constants in the range of A=0.2–1.9×10−6 ergs/cm. The nearest-neighbor exchange parameter J was deduced from A and implies that J varies within a factor of 2 as the value of x changes. In one of the nickel-rich samples, the SWR fields appear to be linear with n implying nonuniform distribution of magnetization in the film.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.340620
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