Electronic Resource
Woodbury, NY
:
American Institute of Physics (AIP)
Applied Physics Letters
78 (2001), S. 1400-1402
ISSN:
1077-3118
Source:
AIP Digital Archive
Topics:
Physics
Notes:
SrS:Cu thin films were evaluated using thermally stimulated luminescence (TSL), photoluminescence (PL), electroluminescence (EL), and charge transfer over a temperature range of 10–850 K. The trap states were measured with and without a BaTa2O6 (BTO) overlayer film. From TSL results, the trap state energies were measured in the range of 0.4 eV, with differences due the BTO overlayer. From the PL, EL, and charge transfer measurements, the light emission and charge transfer decrease at a temperature consistent with the 0.4 eV trap level, demonstrating the importance of the trap states to EL devices. © 2001 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1352667
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