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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 73 (1993), S. 3577-3579 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Quantum transport properties through a variety of electron waveguide structures that have a double-bend geometry are investigated using the recursive Greens function technique. The conductance is calculated as a function of the chemical potential using the two-probe, multichannel Landauer–Büttiker formula. The results for the right-angle double-bend structure are in agreement with previous calculations based on mode-matching techniques. For multiple double-bend structures in series, the existence of an energy gap between the first and second subband threshold energies where the conductance is suppressed is shown. The effects of disorder and thermal broadening on the conductance are also investigated.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 54 (1989), S. 2417-2418 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We report the observation of a thermally driven monolayer to bilayer transition in the period of reflection high-energy electron diffraction oscillations during molecular beam epitaxy on Si(001). This behavior is reproduced in a Monte Carlo growth simulation, from which we infer the origin of the transition results from the competition between incorporation and diffusion kinetics.
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  • 3
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We have developed a fast measuring system of energy dispersive x-ray diffraction intensity. A solid state detector (SSD) has been used to measure the energy dispersive x-ray diffraction intensities. The energy resolution of SSD is almost ten times higher than that of a scintillation counter or proportional counter. For full use of SSD, a fast processing system of the signal is needed, especially when x rays from synchrotron radiation (SR) are used. When SSD is used for x rays from SR, however, we have two problems. One is that the dead time of conventional signal processing system is long, which prevents the efficient use of synchrotron radiation source. The other is that a fast data recording system is needed, because the number of data of a single diffraction spectrum is large. To solve these two problems, we have designed a new measuring system. The system consists of a personal computer and an interface board of multichannel analyzer function. The interface consists of peak hold, fast ADC, memory, add one, and DMA. (1) Improvement of the dead time. We adopted a successive approximation ADC to shorten the conversion time. The dead time is then 2 μs in the present system, which is much shorter than that of the Wilkinson ADC (about 40 μs). (2) Fast data recording. In most conventional MCA, the memory of MCA is separated from that of computer and the data are transferred between MCA and computer. In this case, the data are transferred by GP-IB or RS232C, and the data transfer time is several ten seconds. In the present system, the same memory is accessed by MCA and computer and the data transfer time is zero. This fast measuring system has already been installed at Photon Factory, KEK and utilized to measure the energy dispersive diffraction intensities. We have observed Pendellösung fringe induced by x-ray resonant scattering to make use of this system.
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  • 4
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 60 (1989), S. 1928-1931 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The characteristics of the beamline used for PES (photoelectron spectroscopy) and SEXAFS (surface extend x-ray absorption fine structure) studies at the Photon Factory are described. Monochromatic photons are available in the energy range between 50–900 and 2500–4000 eV. This has been accomplished using a grating/crystal monochromator with a combination of two paraboloidal mirrors. The synchrotron radiation is focused by a set of paraboloidal mirrors at a 1.0° incident grazing angle. The plane grating/mirror combination has covered vacuum ultraviolet region of 50–900 eV with 1200 and 2400 g/mm gratings. The InSb (111) double crystals have covered soft x-ray region of 2500–4000 eV. The performance of the gratings in respect to intensity, resolution, and the effect of "on blaze operation'' is discussed. The Bragg peak searching system in crystal mode and its performance are also described. With the use of InSb(111) crystals, the energy range below 2700 eV will be covered with precise roll adjustment of both 1st and 2nd crystals.
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  • 5
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 62 (1993), S. 1673-1675 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The homoepitaxial growth of Ge(111) has been investigated with reflection high-energy electron diffraction (RHEED) measurements supported by Monte Carlo simulations. At low temperatures, the RHEED oscillations show a monolayer period, while at higher temperatures the oscillation period becomes bilayer. The simulations reveal that a short-range nonthermal diffusion process is dominant at low temperatures, and that the driving force behind the transition to bilayer growth is the increasing importance of thermal diffusion.
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 77 (2000), S. 996-998 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A reconstructed surface of InP (001) substrate, grown by metalorganic vapor phase epitaxy under atmospheric hydrogen environment, is investigated by using grazing incident x-ray diffraction. Fractional-order diffractions of (n/2 m) were observed, showing the existence of a (2×1) domain on the surface. Calculations based on the P-dimer model suggest that there are P dimers whose bonding is parallel to the [1¯10] direction and indium displacement in the second layer. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
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