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  • 1
    Electronic Resource
    Electronic Resource
    The Néel temperature of nanocrystalline chromium (1995)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 78 (1995), S. 1364-1366 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Wide-angle neutron diffraction measurements taken at temperatures from 6 to 250 K indicate that the portion of a chromium sample with a mean grain size of 73 nm is antiferromagnetically ordered at temperatures below 100 K. The Néel temperature (about 120±10 K) for this nanocrystalline sample is suppressed considerably below that of strain-free single-crystal chromium (311 K). © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.360765
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  • 2
    Electronic Resource
    Electronic Resource
    On the two-state microstructure of nanocrystalline chromium (1995)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 77 (1995), S. 522-527 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: High-angle neutron powder diffraction was used to investigate the grain size dependence of the Debye–Waller parameter (DWP) of nanocrystalline and coarse-grained chromium samples. The DWP measured at 20 K depends linearly on inverse grain size and is consistent with a two-state model in which defects with short-ranged displacement fields are present in differing concentrations in two distinct microstructural regions within individual grains. One possible model microstructure consists of grain boundary and free surface regions with significantly larger concentrations of point defects than in grain interiors. Evidence is also seen for an enhancement of the temperature-dependent component of the DWP of chromium with decreasing grain size, indicating different behavior than seen previously for nanocrystalline palladium. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.359035
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  • 3
    Electronic Resource
    Electronic Resource
    Microstructural development in nanophase TiO2 during annealing (1994)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 75 (1994), S. 770-779 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: In situ x-ray-diffraction studies of nanophase TiO2 during annealing reveal a strong angular-dependent decrease in diffuse background intensities and a corresponding increase in rutile and anatase phase peak intensities for samples annealed above 623 K. This behavior is consistent with the crystallization of an amorphous phase present in unannealed samples in addition to the two previously observed crystalline phases. The rutile lattice is significantly strained in unannealed samples, with a0 increased and c0 decreased compared to the values for coarse-grained material. Normal bulk lattice parameters are obtained after annealing samples at 1073 K. Assuming that strain contributions to the measured low-angle peak breadths are negligible, measurements of the time and temperature dependencies of grain growth in nanophase rutile during annealing indicate a grain growth exponent of 0.64±0.06 and a grain growth activation enthalpy of 83±40 kJ/mol.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.356482
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  • 4
    Electronic Resource
    Electronic Resource
    Observation of growth modes during metal-organic chemical vapor deposition of GaN (1999)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 74 (1999), S. 3326-3328 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We present real-time surface x-ray scattering measurements during homoepitaxial growth of GaN by metal-organic chemical vapor deposition. We observed intensity oscillations corresponding to the completion of each monolayer during layer-by-layer growth. The growth rate was found to be temperature independent and Ga-transport limited. Transitions between step-flow, layer-by-layer, and three-dimensional growth modes were determined as a function of temperature and growth rate. © 1999 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.123333
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  • 5
    Electronic Resource
    Electronic Resource
    Determination of the cubic to hexagonal fraction in GaN nucleation layers using grazing incidence x-ray scattering (1998)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 72 (1998), S. 2972-2974 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Recent electron diffraction and microscopy studies of GaN nucleation layers have shown that faults in the stacking of the close-packed planes result in the coexistence of cubic and hexagonal phases within the layers. Using grazing incidence x-ray scattering, we have quantified the proportion of the cubic and hexagonal phases throughout the nucleation layer. We compare the structure of a 20 nm nucleation layer grown on sapphire by atmospheric pressure metal-organic chemical vapor deposition at 525 °C to that of an identical layer heated to 1060 °C. The fractions of cubic and hexagonal phases in the layers are determined by a comparison of the scattering data with a Hendricks–Teller model. High temperature exposure results in a decrease of the cubic fraction from 0.56 to 0.17. The good agreement with the Hendricks–Teller model indicates that the positions of the stacking faults are uncorrelated. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.121511
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  • 6
    Electronic Resource
    Electronic Resource
    In situ x-ray scattering study of PbTiO3 chemical-vapor deposition (2002)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 80 (2002), S. 1809-1811 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We present in situ surface x-ray scattering measurements of PbTiO3 epitaxy by metal–organic chemical-vapor deposition. Oscillations in crystal truncation rod intensity corresponding to layer-by-layer growth are observed under a variety of growth conditions. At lower PbO overpressures, we observe a transition to step-flow growth and an increased rate of recovery after growth, indicating a higher surface mobility. © 2002 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1458530
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  • 7
    Electronic Resource
    Electronic Resource
    Anomalously increased effective thermal conductivities of ethylene glycol-based nanofluids containing copper nanoparticles (2001)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 78 (2001), S. 718-720 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: It is shown that a "nanofluid" consisting of copper nanometer-sized particles dispersed in ethylene glycol has a much higher effective thermal conductivity than either pure ethylene glycol or ethylene glycol containing the same volume fraction of dispersed oxide nanoparticles. The effective thermal conductivity of ethylene glycol is shown to be increased by up to 40% for a nanofluid consisting of ethylene glycol containing approximately 0.3 vol % Cu nanoparticles of mean diameter 〈10 nm. The results are anomalous based on previous theoretical calculations that had predicted a strong effect of particle shape on effective nanofluid thermal conductivity, but no effect of either particle size or particle thermal conductivity. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1341218
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  • 8
    Electronic Resource
    Electronic Resource
    Grain-size-dependent thermal conductivity of nanocrystalline yttria-stabilized zirconia films grown by metal-organic chemical vapor deposition (2000)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 77 (2000), S. 1155-1157 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A grain-size-dependent reduction in the room-temperature thermal conductivity of nanocrystalline yttria-stabilized zirconia is reported for the first time. Films were grown by metal-organic chemical vapor deposition with controlled grain sizes from 10 to 100 nm. For grain sizes smaller than approximately 30 nm, a substantial reduction in thermal conductivity was observed, reaching a value of less than one-third the bulk value at the smallest grain sizes measured. The observed behavior is consistent with expectations based on an estimation of the phonon mean-free path in zirconia.© 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1289803
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