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  • American Institute of Physics (AIP)  (2)
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  • 1
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 68 (1996), S. 1488-1490 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Potassium niobate (KNbO3) thin films and potassium niobate/tantalate (KNbO3/KTaO3) superlattices have been grown on KTaO3 (001) substrates by pulsed laser deposition. The thin-film structures were analyzed by Rutherford backscattering/ion-channeling techniques, x-ray θ–2θ and Φ scans, and both conventional and Z-contrast scanning transmission electron microscopy. Excellent film flatness and crystallinity are evidenced by these techniques. At room temperature, the KNbO3 films are characterized by an orthorhombic structure which differs from that of bulk KNbO3. The interfaces between the layers in the KNbO3/KTaO3 superlattice structures were found to be compositionally sharp on an atomic scale. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 70 (1997), S. 2147-2149 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Synthesis of the perovskite solid solution that forms between metallic SrRuO3 and insulating SrSnO3 is reported. This material is proposed as a conducting thin-film electrode/epitaxial-substrate material. While the bulk solid solution could not be formed, thin films of single-phase SrRu0.5Sn0.5O3 were grown on (001) KTaO3 single-crystal substrates by pulsed laser deposition. These films exhibit a commensurate in-plane lattice match with KTaO3 (a=3.989 Å); accordingly, the lattice constant of SrRu0.5Sn0.5O3 is larger than that of commonly used conducting-oxide thin-film electrodes (e.g., SrRuO3, LaNiO3, and YBa2Cu3O7−δ). The SrRu0.5Sn0.5O3 films were analyzed using x-ray diffraction, Rutherford backscattering, atomic force microscopy, Z-contrast transmission electron microscopy, and Hall effect measurements. The results revealed excellent atomic-scale structural properties, flat surfaces (13 Å rms roughness), and p-type conduction with a room-temperature resistivity of 16 mΩ cm. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
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