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  • American Institute of Physics (AIP)  (2)
  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 61 (1990), S. 253-255 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A high-current ECR source has been developed for oxygen implanters for use in fabricating separation by implanted oxygen (SIMOX) substrates. The new source has the following features: (1) high-current density (150 mA/cm2) and large extracted current (more than 200 mA), (2) stable and long lifetime operation (more than 200 h), (3) high O+ ratio (more than 80%), and (4) low-divergence beam. The improved performance is obtained by incorporating the following: (1) Localized high-density plasma generation at the center of the plasma chamber. (2) A newly developed multilayer window to satisfy two requirements: efficient coupling of the microwave with high-density plasma and high resistance to high-speed backstream electrons. (3) Optimized combination of plasma chamber length and axial magnetic field distribution. (4) Sophisticated compact magnetic circuit that yields the optimum magnetic field for obtaining high-density plasma. An industrial-version ECR source was developed for production use on EATON NV-200 implanters. The source was installed on an NV-200 and used to implant oxygen ions to Si wafers. Good performance compared to a duopigatron source was obtained in terms of beam transport efficiency and reliability of source operation.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 61 (1990), S. 294-296 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: An ECR source has been built for production use on Eaton's NV200 oxygen implanter. It can be retrofitted in place of the duopigatron normally used on that machine. This article reports results of 200 continuous hours of operation of the source, producing 95 mA of O+ ions, on a special test stand which emulates the injector of the NV200. Currents up to 200 mA at 45 kV were briefly obtained on this stand, the upper limit being set by thermal capacity of the beam dump. The ECR source was installed on an NV200 and used to implant wafers at 200 keV. Its performance is compared to that of the duopigatron source under similar conditions.
    Type of Medium: Electronic Resource
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