Electronic Resource
Woodbury, NY
:
American Institute of Physics (AIP)
Applied Physics Letters
80 (2002), S. 407-409
ISSN:
1077-3118
Source:
AIP Digital Archive
Topics:
Physics
Notes:
Recently, several studies have been carried out on sol–gel films for optical applications, mostly motivated by the quickness and low cost of the film preparation process. In order to preserve the coherence properties of the light, improvements in the current quality of such films are necessary as well as appropriated techniques for structural characterization and quality control. X-ray specular reflectivity could be one of such techniques, but it is limited by the complexity of the internal nanostructure of the films. In this work, we have developed a procedure to extract the exact density profile of sol–gel films, and applied it to analyze a sol–gel derived Er2O3 film. © 2002 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1436271
Permalink
|
Location |
Call Number |
Expected |
Availability |
