ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
A simple valid in situ relative intensity calibration technique for soft x-ray film is described. This is based on film exposure measurements of the uniform line-shaped distributed soft x-ray monochromatic irradiation transmitted through a step-wedge absorption filter. Fitting the calibration data with Henke's semiempirical equation for thick-emulsion film, the characteristic curves for Shanghai 5F soft x-ray film without supercoat (SIOM-5FW) have been obtained in the wavelength region from 50 to 80 A(ring).
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1144376
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