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  • American Institute of Physics (AIP)  (1)
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    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 67 (1990), S. 4895-4897 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Films of thickness 350, 500, and 1100 A(ring) rf-magnetron-sputtered onto Corning 7059 glass at a substrate temperature of 250 °C were patterned into aspect ratios of from 10 to 100 with a fixed width of 10 μm by the photolithographic procedure. Gold pads were formed for electrical contacts. Magnetoresistance ratio, saturation field, and in-plane coercivity were measured. The domain patterns were studied by the Bitter method. Results show that the magnetoresistance ratio increases as film thickness increases. In a 500-A(ring)-thick film, the coercivity decreases from 14 to 9.8 Oe with increasing aspect ratio due to closure domain effects.
    Type of Medium: Electronic Resource
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