ALBERT

All Library Books, journals and Electronic Records Telegrafenberg

feed icon rss

Your email was sent successfully. Check your inbox.

An error occurred while sending the email. Please try again.

Proceed reservation?

Export
Filter
  • American Institute of Physics (AIP)  (1)
  • Geological Society of America (GSA)  (1)
  • Institute of Physics  (1)
  • 1
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A general methodology is developed to experimentally characterize the spatial distribution of occupied traps in dielectric films on a semiconductor. The effects of parasitics such as leakage, charge transport through more than one interface, and interface trap charge are quantitatively addressed. Charge transport with contributions from multiple charge species is rigorously treated. The methodology is independent of the charge transport mechanism(s), and is directly applicable to multilayer dielectric structures. The centroid capacitance, rather than the centroid itself, is introduced as the fundamental quantity that permits the generic analysis of multilayer structures. In particular, the form of many equations describing stacked dielectric structures becomes independent of the number of layers comprising the stack if they are expressed in terms of the centroid capacitance and/or the flatband voltage. The experimental methodology is illustrated with an application using thermally stimulated current (TSC) measurements. The centroid of changes (via thermal emission) in the amount of trapped charge was determined for two different samples of a triple-layer dielectric structure. A direct consequence of the TSC analyses is the rigorous proof that changes in interface trap charge can contribute, though typically not significantly, to thermally stimulated current.
    Type of Medium: Electronic Resource
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
  • 2
    Publication Date: 2016-08-23
    Description: Understanding fault slip rates in the eastern California shear zone (ECSZ) using GPS geodesy is complicated by potentially overlapping strain signals due to many sub-parallel strike-slip faults and by inconsistencies with geologic slip rates. The role of fault system geometry in describing ECSZ deformation may be investigated with total variation regularization, which algorithmically determines a best-fitting geometry from an initial model with numerous faults, constrained by a western United States GPS velocity field. The initial dense model (1) enables construction of the first geodetically constrained block model to include all ECSZ faults with geologic slip rates, allowing direct geologic-geodetic slip rate comparisons, and (2) permits fault system geometries with many active faults that are analogous to distributed interseismic deformation. Beginning with 58 ECSZ blocks, a model containing 10 ECSZ blocks is most consistent with geologic slip rates, reproducing five of 11 within their reported uncertainties. The model fits GPS observations with a mean residual velocity of 1.5 mm/yr. Persistent geologic-geodetic slip rate discrepancies occur on the Calico and Garlock faults, on which we estimate slip rates of 7.6 mm/yr and 〈2 mm/yr, respectively, indicating that inconsistencies between geology and geodesy may be concentrated on or near these faults and are not due to pervasive distributed deformation in the region. Discrepancies may in part be due to postseismic relaxation following the A.D. 1992 M w 7.3 Landers and 1999 M w 7.1 Hector Mine earthquakes. Otherwise, resolving geologic-geodetic discrepancies would require as much as 11.4 mm/yr of off-fault deformation within 〈10 km of the main ECSZ faults, with ~5 mm/yr concentrated near the Calico fault.
    Print ISSN: 0091-7613
    Electronic ISSN: 1943-2682
    Topics: Geosciences
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
  • 3
    Publication Date: 1958-07-01
    Print ISSN: 0950-7671
    Topics: Electrical Engineering, Measurement and Control Technology , Physics
    Published by Institute of Physics
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
Close ⊗
This website uses cookies and the analysis tool Matomo. More information can be found here...