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  • 1
    Electronic Resource
    Electronic Resource
    Electron acoustic imaging of BaTiO3 single crystals (1996)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 80 (1996), S. 1916-1918 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Scanning electron acoustic microscopy (SEAM) has been used in the observation of ferroelectric domain configurations in barium titanate single crystals. The contribution to the image contrasts is related to signal generation through a piezoelectric coupling mechanism. The results prove that SEAM really has the ability to show not only the surface shape and domain structures but also the subsurface domain structures. Furthermore, SEAM is a convenient, fast and nondestructive way of observing the ferroelectric domains compared with other methods. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.363008
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  • 2
    Electronic Resource
    Electronic Resource
    Influence of crystal imperfection on high-resolution diffraction profiles of silicon single crystals measured by highly collimated x-ray beams (1991)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 58 (1991), S. 2246-2248 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We examined high-resolution diffraction profiles of as-grown and annealed magnetic-field-applied Czochralski (MCZ) silicon crystals which were about 300 μm thick and [001] oriented, and compared these profiles with the ultraplane wave x-ray topographs. Rocking curves for the symmetric 220 diffraction were measured in the Laue geometry using a (+m, −n, +n) separated three-crystal monochromator. Strain introduced in the sample preparation process gave a reduced oscillatory profile of a rocking curve although chemical etching recovered subsidiary peaks of the rocking curve. Strain frozen in as-grown crystals also gave a reduced oscillatory-profile, but a large number of oxygen precipitates produced by thermal annealing caused little reduction of subsidiary peaks.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.104940
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  • 3
    Electronic Resource
    Electronic Resource
    Time-resolved x-ray measurement system for studying the lattice deformation of semiconductor crystals under laser irradiation : INTERNATIONAL CONFERENCE ON SYNCHROTRON RADIATION INSTRUMENTATION (1989)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 60 (1989), S. 2342-2345 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: This article describes the outline of a time-resolved x-ray measurement system developed at the Photon Factory to study the pulsed laser annealing of silicon crystals. This system consists of a triple-crystal diffractometer, Q-switched Nd:YAG laser, and two fast detector electronics using a plastic scintillation counter, and enables us to examine the time-change behavior of nearly intrinsic rocking curves under laser irradiation with a time resolution of about 50 ns. The difference in the recovery from lattice deformation between 1.06-μm laser annealing and 0.53-μm laser annealing is clarified.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1140764
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  • 4
    Electronic Resource
    Electronic Resource
    Performance of an imaging plate as an x-ray area detector used for plane-wave x-ray diffraction topography (1995)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 66 (1995), S. 4487-4491 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We report the linearity, spatial resolution, and granularity of x-ray intensity images recorded on imaging plates (IPs). The IP-processing system, designed for use with a transmission electron microscope (TEM), was used to evaluate the influence of these characteristics on profiles of local lattice distortion in silicon obtained by plane-wave x-ray diffraction topography (PWT). The signal intensity was linear with x-ray doses over four orders of magnitude of intensity, as has also been reported in the case of TEM. The modulation transfer function and root mean square of x-ray intensity images were measured to evaluate the spatial resolution and granularity. The results indicate that profiles of lattice distortion with a period of more than 0.5 mm can be reproduced by PWT in combination with the present IP-processing system. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1146420
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  • 5
    Electronic Resource
    Electronic Resource
    A new technique for time-resolved x-ray diffraction measurements in the single-bunch operation applied to laser annealing : Proceedings of the 5th international conference on synchrotron radiation instrumentation (1995)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 66 (1995), S. 1419-1421 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We propose a new technique that is applicable to the time-resolved measurement of deformation on silicon surface during pulsed laser annealing in the single-bunch operation of the Photon Factory. There is a distribution of delay times between the activation of external trigger and the laser firing (the jitters) in the external trigger operation of laser equipment. This time distribution clearly makes the time-resolved measurement inaccurate. To overcome this disadvantage, a time-resolved measurement system that utilizes this time distribution has been developed. This system was composed of two TACs. The time distribution of the bunch (event number) and the time distribution of the intensity of the x rays diffracted from the silicon surface were measured. The respective signals were then accumulated in MCA1 and MCA2. The time course of the diffraction intensity before and after the laser irradiation was obtained by normalizing the time distribution of the intensity of the diffracted x rays with the time distribution of the event number. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1145927
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  • 6
    Electronic Resource
    Electronic Resource
    Imaging-plate plane-wave x-ray topography of local lattice distribution due to growth striations in silicon crystals (1993)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 62 (1993), S. 2980-2982 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A newly developed imaging-plate plane-wave x-ray topography (IPPWT) method has been successfully applied to the quantitative analysis of local lattice distortion due to growth striations in magnetic-field-applied Czochralski silicon single crystals. IPPWT was found to possess sufficient spatial resolution to accurately measure variations of growth-induced local lattice distortions (Δd/d and Δα). The advantageous features of IPPWT, in comparison with conventional photographic-plate plane-wave x-ray topography, are a wide latitude in x-ray exposure conditions, better x-ray intensity linearity for performing quantitative analysis, and convenience in image processing and data handling.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.109163
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  • 7
    Electronic Resource
    Electronic Resource
    Microheterogeneity and relaxation in 0.65Pb(Mg1/3Nb2/3)O3–0.35PbTiO3 relaxor single crystals (2000)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 77 (2000), S. 1271-1273 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Micro-Brillouin scattering has been applied to the observation of the microheterogeneity and the fast relaxation of 0.65 Pb(Mg1/3Nb2/3)O3–0.35PbTiO3 single crystals in various microareas with the size of 1–2 μm. Cubic–tetragonal at TC–T and tetragonal–rhombohedral around TT–R transitions show different types of acoustic anomalies. It was found that local symmetry varies from one microarea to others below TC–T. Intense quasielastic scattering was observed below 250 °C; it is correlated with thermally activated fast relaxations of polar microregions. The results show that microheterogeneity and related dynamics of polar microregions are origins of relaxor phase transitions and are responsible for macroscopic properties like hypersonic damping. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1289909
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  • 8
    Electronic Resource
    Electronic Resource
    Refinement of time-resolved x-ray measurement system for studying the lattice deformation of silicon under pulsed Nd:YAG laser irradiation : Proceedings of the 4th international conference on synchrotron radiation instrumentation (1992)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 63 (1992), S. 1164-1167 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The time-resolved x-ray measurement system using the TAC technique and the MCS technique has been improved after the previous SRI conference. The improved TAC technique enables us to measure a time-resolved x-ray diffraction intensity distribution across a laser spot at any time after laser flashing with a time resolution of 25 ns under the multibunch operation of synchrotron radiation sources. Optical fiber delay units are developed for the MCS technique instead of ECL delay units to obtain long delay time for detective signals.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1143123
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  • 9
    Electronic Resource
    Electronic Resource
    Phase transition in constrained polymer gels (1994)
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 101 (1994), S. 10003-10007 
    Details
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: Equilibrium diameter and stress change of cylindrical N-isopropylacrylamide gels of submillimeter diameter were measured as a function of temperature under mechanical constraint along the uniaxial direction. As a result, the transition temperature increased up to 1 °C with increasing the strain, which indicates the possibility of the uniaxial strain-induced phase transition of gels at selected temperatures. The diameter and stress change were quite successfully described by the phenomenological model on the basis of the extended Flory-type free energy. The time course of the change in diameter and stress was also studied after the large steplike elongation was rapidly applied. A gradual increase in diameter during decrease in stress was detected clearly in the swollen phase, which is due to the relaxation of polymer segmental units to approach the favored conformation under the strong deformation. © 1994 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.468049
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  • 10
    Electronic Resource
    Electronic Resource
    Fast relaxation, boson peak, and anharmonicity in Li2O–B2O3 glasses (2000)
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 113 (2000), S. 6344-6350 
    Details
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: Glasses with a composition xLi2O⋅(1−x)B2O3 were investigated by low-frequency Raman scattering in the composition range x=0–0.28. The evolution of the quasielastic line, the boson peak, the Debye frequency, and some other glass parameters with the composition was analyzed. The frequency of the boson peak ωb shifts with changing x by a factor of 3 and the width of the quasielastic spectrum at room temperature is always equal to ∼0.24ωb. The Grüneisen parameter of the glasses is estimated on the basis of the light scattering data for the boson peak frequency within the frames of the anharmonic model of the fast relaxation and using the sound velocity data—for the Debye frequency. The anharmonic properties are compared with the fragility of these glassformers; it is shown that the fragility increases with anharmonicity. It is shown also that the width of the glass transition region correlates with the anharmonic properties. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1309530
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