Publication Date:
2015-12-04
Description:
Author(s): Dario Ossola, Livie Dorwling-Carter, Harald Dermutz, Pascal Behr, János Vörös, and Tomaso Zambelli We combined scanning ion conductance microscopy (SICM) and atomic force microscopy (AFM) into a single tool using AFM cantilevers with an embedded microchannel flowing into the nanosized aperture at the apex of the hollow pyramid. An electrode was positioned in the AFM fluidic circuit connected to a… [Phys. Rev. Lett. 115, 238103] Published Thu Dec 03, 2015
Keywords:
Polymer, Soft Matter, Biological, and Interdisciplinary Physics
Print ISSN:
0031-9007
Electronic ISSN:
1079-7114
Topics:
Physics
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