Publication Date:
2016-01-21
Description:
Author(s): J. A. Sans, F. J. Manjón, A. L. J. Pereira, R. Vilaplana, O. Gomis, A. Segura, A. Muñoz, P. Rodríguez-Hernández, C. Popescu, C. Drasar, and P. Ruleova Compresed BiTeBr has been studied from a joint experimental and theoretical perspective. Room-temperature x-ray diffraction, Raman scattering, and transport measurements at high pressures have been performed in this layered semiconductor and interpreted with the help of ab initio calculations. A rev… [Phys. Rev. B 93, 024110] Published Fri Jan 15, 2016
Keywords:
Structure, structural phase transitions, mechanical properties, defects
Print ISSN:
1098-0121
Electronic ISSN:
1095-3795
Topics:
Physics
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