Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Review of Scientific Instruments
59 (1988), S. 391-393
ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
It is demonstrated in this note that optical Polaroid Land films can be used as a convenient detector in the soft x-ray region. The performance of Polaroid 667 film has been found to be comparable to that of the Kodak direct exposure film (DEF) for soft x-ray pinhole imaging. By a suitable choice of multiple filters, qualitative information about a dense plasma has been obtained.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1140217
Permalink
|
Location |
Call Number |
Expected |
Availability |