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  • Artikel  (4)
  • CdTe  (4)
  • Wiley-Blackwell  (4)
  • American Association for the Advancement of Science (AAAS)
  • Blackwell Publishing Ltd
  • Institute of Physics
  • Elektrotechnik, Elektronik, Nachrichtentechnik  (4)
  • Maschinenbau
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  • Artikel  (4)
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  • Wiley-Blackwell  (4)
  • American Association for the Advancement of Science (AAAS)
  • Blackwell Publishing Ltd
  • Institute of Physics
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  • Elektrotechnik, Elektronik, Nachrichtentechnik  (4)
  • Maschinenbau
  • Physik  (4)
  • 1
    Digitale Medien
    Digitale Medien
    New York, NY [u.a.] : Wiley-Blackwell
    Advanced Materials for Optics and Electronics 7 (1997), S. 1-8 
    ISSN: 1057-9257
    Schlagwort(e): CdTe ; iodine doping ; electrical activity ; Chemistry ; Polymer and Materials Science
    Quelle: Wiley InterScience Backfile Collection 1832-2000
    Thema: Elektrotechnik, Elektronik, Nachrichtentechnik , Physik
    Notizen: The electrical activity of iodine in CdTe is discussed when iodine is introduced into the CdTe by diffusion from the vapour phase. It is compared both with the total concentration of iodine in the diffused CdTe slices and with the electrical activity in CdTe slices which have been annealed under Cd- and Te-saturated vapour pressures.Iodine-diffused slices of CdTe were profiled by secondary ion mass spectrometry (SIMS) to obtain the total iodine concentration and by capacitance-voltage (C-V) techniques to obtain the net concentration of electrically active iodine. After annealing with iodine in the form of Cdl2, the slices were p-type, similar to those obtained when CdTe was annealed in either excess Te or Cd vapour, and they showed no significant increase in electrical activity. If Cd was added to the Cdl2 diffusion source or the CdTe was given a subsequent anneal in cadmium vapour, the slices became n-type. The results indicated that in all cases a neutral layer composed of Cd nIm (m and n are integers) formed on the surface layers, whereas if Cd was involved in the diffusion, some of the iodine existed in an electrically active form deeper into the slice with a maximum concentration of active carriers given by ND - NA ≈ 1017 cm-3. © 1997 John Wiley & Sons Ltd.
    Zusätzliches Material: 6 Ill.
    Materialart: Digitale Medien
    Standort Signatur Erwartet Verfügbarkeit
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  • 2
    Digitale Medien
    Digitale Medien
    New York, NY [u.a.] : Wiley-Blackwell
    Advanced Materials for Optics and Electronics 3 (1994), S. 269-274 
    ISSN: 1057-9257
    Schlagwort(e): Compensation defects ; PICTS ; CdTe ; Tikhonov regularisation ; III-posed problems ; Deep levels ; Chemistry ; Polymer and Materials Science
    Quelle: Wiley InterScience Backfile Collection 1832-2000
    Thema: Elektrotechnik, Elektronik, Nachrichtentechnik , Physik
    Notizen: A detailed analysis of photoinduced current transients of differntly grown CdTe:Cl samples was performed in the 100-130 K range in order to investigate the influence of the different growth techniques (sublimation, Bridgman method and travelling heater method (THM)) on the compensation defects. The transients were evaluated using a regularisation method (fast Tikhonov regularisation) as implimented in the program FTIKREG. The advantages of the regularisation method in comparison with the customary two-gate technique are demonstrated by the analysis of simulated data. It can be shown that the different growth techniques have only one level in common. Furthermore, the superposition of different traps can lead to wrong results using the conventional two-gate technigque. The temperature dependence of the relaxation times is evaluated and the corresponding trap parameters are determined.
    Zusätzliches Material: 8 Ill.
    Materialart: Digitale Medien
    Standort Signatur Erwartet Verfügbarkeit
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  • 3
    Digitale Medien
    Digitale Medien
    New York, NY [u.a.] : Wiley-Blackwell
    Advanced Materials for Optics and Electronics 5 (1995), S. 157-161 
    ISSN: 1057-9257
    Schlagwort(e): CdTe ; iodine doping ; diffusion ; Chemistry ; Polymer and Materials Science
    Quelle: Wiley InterScience Backfile Collection 1832-2000
    Thema: Elektrotechnik, Elektronik, Nachrichtentechnik , Physik
    Notizen: Studies on the diffusion of iodine into CdTe at a temperature of 20°C using four widely differing types of diffusion sources are compared and discussed. The concentration profiles were measured using either a radiotracer sectioning (RTS) technique or secondary ion mass spectrometry (SIMS).The profiles were composed of four parts to which a computer package consisting of the sum of four complementary error functions (erfc) gave accurate fits, providing four empirical values of the diffusivity. The diffusivities for the fastest component in all four cases were in agreement (∼2 × 10-14 cm2 s-1) and were consistent with previously published data. These results indicate that when iodine is diffused from the vapour it is not a suitable long-termstable dopant in devices where sharp junctions are required.
    Zusätzliches Material: 4 Ill.
    Materialart: Digitale Medien
    Standort Signatur Erwartet Verfügbarkeit
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  • 4
    Digitale Medien
    Digitale Medien
    New York, NY [u.a.] : Wiley-Blackwell
    Advanced Materials for Optics and Electronics 3 (1994), S. 223-232 
    ISSN: 1057-9257
    Schlagwort(e): CdTe ; ZnTe ; Impurities ; Spin resonance ; Chemistry ; Polymer and Materials Science
    Quelle: Wiley InterScience Backfile Collection 1832-2000
    Thema: Elektrotechnik, Elektronik, Nachrichtentechnik , Physik
    Notizen: We present results of electron paramagnetic resonance (EPR) and optical spectroscopy on different charge states of the transition metal impurity iron in ZnTe and CdTe. We identify the energy level position of the Fe+ acceptor in ZnTe at Ev + 1.7eV and estimate its position in CdTe. Ionisation transitions from Fe+to the conduction and valence bands ar found in both absorption spectroscopy and photo-EPR. Optical intra-defect tracsitions from Fe+ to crystalfield-split excited states ar resolved for the first time. This assignment to Fe2+ is based on optically detected EPR. Application of both far-infrared Fourier transform and EPR spectroscopy allows the determination of the total iron concentration in all charge states.
    Zusätzliches Material: 12 Ill.
    Materialart: Digitale Medien
    Standort Signatur Erwartet Verfügbarkeit
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