ISSN:
1600-5724
Source:
Crystallography Journals Online : IUCR Backfile Archive 1948-2001
Topics:
Chemistry and Pharmacology
,
Geosciences
,
Physics
Notes:
A double diffractometric verification of diffraction patterns of thin perfect crystals has been tried. In this case the diffraction patterns should be accompanied by `Pendellösung' fringes of equal inclination. This aim could not be reached directly on account of the difficulty of preparing crystal sheets of the necessary extremely small thickness without lattice bending. But photographically the expected fringes appeared as fringes of `equal orientation' on double diffractometric topographs of silicon sheets between 5 and 2μ in thickness, not only in the Laue case but also in the Bragg case. This is the first observation of Pendellösung in the Bragg case.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1107/S0567739468000185
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