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  • Physics  (2)
  • Biochemistry and Biotechnology
  • ELECTRONICS AND ELECTRICAL ENGINEERING
  • 1970-1974  (2)
Collection
Keywords
Publisher
Years
Year
  • 1
    Electronic Resource
    Electronic Resource
    New York : Wiley-Blackwell
    Journal of Polymer Science: Polymer Physics Edition 10 (1972), S. 2397-2407 
    ISSN: 0098-1273
    Keywords: Physics ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology , Physics
    Notes: Polyethylene single crystals deformed on copper and NaCl single-crystal substrates by the method of Gleiter and Argon were examined in transmission electron microscopy attached to carbon film carriers constraining them to their deformed state and also after they have been removed from the deformed substrates and were allowed to relax. It was observed that the imposed shear strains can be accommodated by the polyethylene crystals by a combination of debonding from the substrate, elastic flexing, extensive inplane twinning and martensitic shear transformations, buckling, and tearing. No contrast effects suggestive of slip lines could be observed in dark field studies, and the gold droplet decoration technique failed to detect any unambiguous slip lines. From this it is concluded that the critical shear stress for slip is always higher than that for twinning and martensitic shear transformations, and that crystals will deform preferentially by these latter modes.
    Additional Material: 7 Ill.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    New York : Wiley-Blackwell
    Journal of Polymer Science: Polymer Physics Edition 11 (1973), S. 2199-2208 
    ISSN: 0098-1273
    Keywords: Physics ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology , Physics
    Notes: Lexan polycarbonate specimens in the form of tubes were deformed in torsion. The deformation occurs by the nucleation and growth of discrete shear bands. Shear bands are initially formed at the upper yield point. Development of the bands is accompanied by a drop in the stress to a lower yield point. At the lower yield point the strain inside the bands is approximately 70% and remains constant thereafter. Further deformation occurs by growth of the bands until they cover the entire sample. When the direction of twisting is reversed after the shear bands are formed, the deformed material untwists uniformly, without deformation in the previously undeformed material, and the stress required for untwisting the deformed material is lower than the stress required to propagate the band into undeformed material.
    Additional Material: 5 Ill.
    Type of Medium: Electronic Resource
    Location Call Number Expected Availability
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