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Components of the sex pheromone of the female spotted stalk borer,Chilo partellus (Swinhoe) (Lepidoptera: Pyralidae): Identification and preliminary field trials (1979)

Nesbitt, Brenda F. ; Beevor, P. S. ; Hall, D. R. ; [et al.]

Springer

Journal of chemical ecology 5 (1979), S. 153-163

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ISSN: 1573-1561

Keywords: Sex pheromone ; sex attractant ; Lepidoptera ; Pyralidae ; Chilo partellus ; spotted stalk borer ; electroantennography ; (Z)-11-hexadecenal ; (Z)-11-hexadecen-1-ol ; (Z)-9-tetradecenyl formate

Source: Springer Online Journal Archives 1860-2000

Topics: Biology , Chemistry and Pharmacology

Notes: Abstract FemaleChilo partellus (Swinhoe) abdominal tip extracts were examined by gas-liquid chromatography (GLC) combined with simultaneous electroantennographic (EAG) recording from the male moth. Two olfactory stimulants were detected and identified as (Z)-11-hexadecenal (I) and (Z)-11-hexadecen-1-ol (II) by their GLC behavior, microchemical reactions, and comparison with synthetic materials. Both compounds were detected in volatiles emitted by the “calling” female moth. Synthetic (Z)-9-tetradecenyl formate, a structural analog of aldehyde (I), also elicited a significant EAG response from the male moth. Field trials carried out in India using synthetic (I) and (II) as bait in water traps showed that compound (I) was highly attractive to maleC. partellus; compound (II) was not attractive, and its addition to (I) significantly reduced trap catches.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1007/BF00987696

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Composition-Depth profiling and interface analysis of surface coatings using ball cratering and the scanning auger microprobePaper presented at the International Conference on Quantitative Surface Analysis, held at the National Physical Laboratory, Teddington, UK, 16-17 October 1979. (1979)

Walls, J. M. ; Hall, D. D. ; Sykes, D. E.

Chichester [u.a.] : Wiley-Blackwell

Surface and Interface Analysis 1 (1979), S. 204-210

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ISSN: 0142-2421

Keywords: Chemistry ; Polymer and Materials Science

Source: Wiley InterScience Backfile Collection 1832-2000

Topics: Physics

Notes: The provision of accurate composition-depth profiles to depths 〉 1 μm is important in the characterization and investigation of thick films, surface coatings, surface treatments and many other technologically important applications. At present, such profiles are usually achieved by sequential ion bombardment and surface analysis and hence involve many difficulties in interpretation due to the non-uniform erosion of surfaces under ion bombardment. In this paper a method of obtaining accurate depth profiles is described using a ball-cratering device. The method employs a rotating ball to fashion a well-defined spherical crater in the sample surface, the depth and width of which can be accurately controlled. The specimen is then cleaned in situ using a scanning ion beam for a short period and the composition-depth profile is obtained either by point-by-point analysis down the sloping sides of the crater wall or by using Auger line-scan techniques across the crater. Coating-substrate interface analysis can also be obtained by sputter-depth profiling at a point on the coating close to the exposed substrate. The method is not only considerably faster than ion etching, but the resulting depth profile also has a well-defined depth resolution. Composition-depth profiles through nitrocarburized mild steel surfaces and protective surface coatings are presented to illustrate the usefulness of the technique.

Additional Material: 10 Ill.