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  • International Union of Crystallography (IUCr)  (2)
  • 1975-1979  (2)
  • 1910-1914
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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 33 (1977), S. 954-961 
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: A Monte Carlo computer simulation of a neutron diffraction experiment is presented which is of particular use for systems where the structure factor modulates considerably. The program has been optimized by forcing successive scattering events to occur within the specimen under study, and by calculating the score into the detector at each scattering point to allow each simulated path to contribute to the detected scattered intensity. A method of determining the multiple scattering correction for time-of-flight diffraction is shown, and the results of such an analysis are presented for a specimen with intense forward angle scattering and strongly varying S(Q).
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 33 (1977), S. 962-967 
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: The method of determining corrections to neutron time-of-flight diffraction data by Monte Carlo techniques is costly since a large range of neutron wavelengths must be considered. An optimized simulation is presented in which many wavelengths are considered simultaneously, while paths are traced only once for all wavelengths. Collision positions and scattering angles are selected from cumulative distribution functions representing all neutron wavelengths simulated. The scattered intensity is computed by weighting the simulated paths to account for the probability of their occurrence for each wavelength. The results of a calculation for a vanadium slab are given as an example.
    Type of Medium: Electronic Resource
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