Publikationsdatum:
2019-06-28
Beschreibung:
The secondary electron emission coefficient was obtained for a FEP-Teflon dielectric charged with monoenergetic electrons normally incident upon the surface of the specimen. Measurements of secondary emission coefficient were done for normal and oblique incidence with different primary beam energies in the presence of normal and oblique electric fields. A collimated probing beam was directed to different points on the surface of the specimen and the released or accumulated charge was monitored using an electrometer. The measured data for different probing beam energies, different impact points and different angles of incidence were plotted vs. impact energy and impact point. Data analyzed by computer simulations to find the potential distribution on the surface of the specimen and the electric field around it, is presented and discussed.
Schlagwort(e):
ELECTRONICS AND ELECTRICAL ENGINEERING
Materialart:
NASA-CR-168558
Format:
application/pdf
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