Electronic Resource
Copenhagen
:
International Union of Crystallography (IUCr)
Applied crystallography online
17 (1984), S. 154-158
ISSN:
1600-5767
Source:
Crystallography Journals Online : IUCR Backfile Archive 1948-2001
Topics:
Geosciences
,
Physics
Notes:
The measurement of the spectral intensity distribution of the incident beam in energy-dispersive X-ray diffractometry has been examined by several methods. The spectral distribution estimated from the integrated intensity of a well defined reflection at several energies is the most reliable. Three direct measurements of the spectral distribution by a solid-state detector are also examined. Of these only the measurement at very low tube current can be used in structure factor determination, but the accuracy is about 5% even for strong reflections.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1107/S0021889884011225
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