Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Review of Scientific Instruments
60 (1989), S. 214-218
ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
Recently, several x-ray techniques have been demonstrated to have unique capabilities of making microscopic measurement on a monolayer supported on a liquid subphase. Substantial information about the phase transitions and chemical reactions of the monolayer system previously unavailable has been obtained. In this paper a Langmuir trough designed to perform these x-ray experiments is described. Design considerations specific for the x-ray applications are discussed, and the hardware implementation is described. The trough has been used successfully in our monolayer study using surface extended x-ray absorption fine structure (SEXAFS) and near total external fluorescence (NTEF) techniques.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1140463
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