Electronic Resource
Springer
Fresenius' Zeitschrift für analytische Chemie
329 (1987), S. 129-132
ISSN:
1618-2650
Source:
Springer Online Journal Archives 1860-2000
Topics:
Chemistry and Pharmacology
Notes:
Summary Charge effects perturb the analysis of poorly conducting materials (glass, ceramics, polymers etc.) via modern surface physics methods which use charged primary and/or secondary particles. This is also true for secondary ion mass spectrometry (SIMS). The use of neutral primary particles (Neutral Primary Beam-SIMS = NPB-SIMS) reduces such perturbations appreciably: positive as well as negative secondary ions may be analyzed. The original distribution of very mobile species in the matrix to be analyzed will not be changed if certain conditions are observed. With this in mind the analysis of chemical and isotopic concentration profiles is possible as they are encountered in corrosion processes, tracer diffusion experiments, and surface engineering or semiconductor technology.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF00469123
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