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  • 1985-1989  (2)
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  • 1
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    Unknown
    Reliability and engineering of thin-film photovoltaic modules (1985)
    In:  CASI
    Details
    Publication Date: 2016-06-07
    Description: Objectives were to: examine thin-film cell attributes that influence module performance and reliability, explore the lessons and applicability of crystalline-silicon module technology to thin-film modules, review the current status of thin-film module technologies, and identify problem areas and needed research. A major need is to separate the effects and resons for reversible degradatin from nonreversible degradation. Amorphous-silicon (a-Si) reliability investigations are focusing on exploratory research investigations, accelerated Arrhenius-type testing of a-Si cells, real-time outdoor exposure testing of a-Si cells, cell failure analysis, and failure mechanism research. Studies included the reduction in strength of glass by high temperature depositions on glass and laser scribing, encapsulation materials development needs, and the testing of modules. The new materials and processes in thin-film modules will require a delinquent reliability effort, including: establishment of mechanism-specific reliability goals; quantification of mechanism parameter dependencies; prediction of expected long-term degradation; identification of cost-effective solutions; and testing and failure analysis of trial solutions.
    Keywords: ENERGY PRODUCTION AND CONVERSION
    Type: Proceedings of the 25th Project Integration Meeting; p 137-143
    Format: application/pdf
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    NASA TECHNICAL REPORTS
  • 2
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    Unknown
    Reliability and Engineering of Thin-Film Photovoltaic Modules. Research forum proceedings (1985)
    In:  CASI
    Details
    Publication Date: 2019-07-13
    Description: A Research Forum on Reliability and Engineering of Thin Film Photovoltaic Modules, under sponsorship of the Jet Propulsion Laboratory's Flat Plate Solar Array (FSA) Project and the U.S. Department of Energy, was held in Washington, D.C., on March 20, 1985. Reliability attribute investigations of amorphous silicon cells, submodules, and modules were the subjects addressed by most of the Forum presentations. Included among the reliability research investigations reported were: Arrhenius-modeled accelerated stress tests on a Si cells, electrochemical corrosion, light induced effects and their potential effects on stability and reliability measurement methods, laser scribing considerations, and determination of degradation rates and mechanisms from both laboratory and outdoor exposure tests.
    Keywords: ENERGY PRODUCTION AND CONVERSION
    Type: NASA-CR-176217 , DOE/JPL-1012-111 , JPL-PUB-85-73 , NAS 1.26:176217 , Mar 20, 1985; Washington, DC; United States
    Format: application/pdf
    Location Call Number Expected Availability
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    NASA TECHNICAL REPORTS
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