ISSN:
1573-4803
Source:
Springer Online Journal Archives 1860-2000
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
Notes:
Abstract The dielectric constantε of amorphous selenium at 330kHz has been measured under vacuum as a function of time on different isothermsT a. After a normal heating period, depending onT a, the value ofε increases abruptly from 5.8 to a maximum (9.6 to 11) followed by a decrease to reach a constant value. The behaviour of the curvesε=f(t) is discussed in terms of the structural transformation in the amorphous matrix. The morphological changes during the spherulite growth of selenium are also discussed. The dielectric loss tanδ has been calculated during the crystallization stages using the mesurements of time-dependence of resistivityr(t). The crystallization kinetic parameters have also been computed from the variation ofε during the growth stage. A value of 1.2eV is obtained for the activation energy of the radial growth of selenium in the temperature range 90 to 140° C.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF00553062
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