ISSN:
1573-4803
Source:
Springer Online Journal Archives 1860-2000
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
Notes:
Abstract Thin films of ZnIn2Te4 are grown onto glass substrates by the flash evaporation technique. Electrical properties such as electrical resistivity and activation energy were studied with different substrate temperatures ranging from 300 to 623 K. It is observed that the film grown at a substrate temperature of 523 K is a single phase polycrystalline stoichiometric film with minimum electrical resistivity. The effect of the film thickness on the electrical properties of ZnIn2Te4 thin films grown at a substrate temperature of 523 K has been studied. The experimental data can be satisfactorily explained on the basis of the Fuchs-Sondheimer theory.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF01139038
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