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  • ELECTRONICS AND ELECTRICAL ENGINEERING  (2)
  • trichothecene
  • 1985-1989  (2)
  • 1
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    Random vibration (stress screening) of printed wiring assemblies (1988)
    In:  CASI
    Details
    Publication Date: 2013-08-31
    Description: The results of a random vibration test screening (RVSS) study of the determination of the upper and lower vibration limits on printed wiring assemblies (PWA) are summarized. The study results are intended to serve as a guide for engineers and designers who make decisions on PWA features that need to withstand the stresses of dynamic testing and screening. The maximum allowable PWA deflection, G levels, and PSD levels are compared to the expected or actual levels to determine if deleterious effects will occur.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Marshall Space Flight Center, The 58th Shock and Vibration Symposium, Volume 2; p 111-147
    Format: application/pdf
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    NASA TECHNICAL REPORTS
  • 2
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    Solid state imagers and their applications; Proceedings of the Meeting, Cannes, France, November 26, 27, 1985 (1986)
    In:  Other Sources
    Details
    Publication Date: 2019-06-28
    Description: Topics treated include the use of semiconductor imagers in high energy particle physics, an X-ray image sensor based on an optical TDI-CCD imager, and an electron-sensitive CCD readout array for a circular-scan streak tube. Papers are presented on the pan-imager, high resolution linear arrays, the reduction of reflection losses in solid-state image sensors, a high resolution CCD imager module with swing operation, large area CCD image sensors for scientific applications, and new readout techniques for frame transfer CCDs. Consideration is given to advanced optoelectronical sensors for autonomous rendezvous/docking and proximity operations in space, the testing and characterization of CCDs for the Rosat star sensors, an advanced radial camera for the Hubble Space Telescope, and scanning or staring infrared imagers.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: SPIE-591
    Format: text
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    NASA TECHNICAL REPORTS
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