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Chromosomes and their relationship to nuclear components during the cell cycle in Chinese hamster cells (1988)

Chai, Lee S. ; Sandberg, Avery A.

Springer

Cell & tissue research 251 (1988), S. 197-204

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ISSN: 1432-0878

Keywords: Chromosome ; Nuclear matrix ; Nuclear membrane ; Cell cycle ; Enzyme treatment ; Chinese hamster

Source: Springer Online Journal Archives 1860-2000

Topics: Biology , Medicine

Notes: Summary Chromosomes and their relationship to nuclear components during various phases of the cell cycle were studied with different fixation, embedding, and enzyme techniques. The results showed that interphase chromosomes may have oriented in such a way that a given locus became associated with the nuclear membrane. Some chromosomes also appeared to interact with the nucleolus. The nuclear matrix materials, however, were distributed between the chromosomes and formed a delineating boundary for the chromosomes. These matrix materials, furthermore, formed channel-like structures within the nucleus and towards the cytoplasm through their interaction with nuclear pore complexes. During mitosis, chromosomes were encapsulated with material that appeared to be derived from the matrix, disintegrated residues and fragments of the nuclear envelope, the lamina, and nucleolar material. These chromosome-associated materials seen in mitosis appeared to serve as foci for formation of new nuclear components in subsequent interphase.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1007/BF00215465

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Analysis of epitaxial CdxHg1 - xTe layers using RBS, SIMS and EERPaper presented at the IB-SA 88 Meeting, University of Paris VII (Jussieu), 7-8 December 1988. (1989)

Diskett, D. J. ; Avery, A. J. ; Blackmore, G. ; [et al.]

Chichester [u.a.] : Wiley-Blackwell

Surface and Interface Analysis 14 (1989), S. 717-724

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ISSN: 0142-2421

Keywords: Chemistry ; Polymer and Materials Science

Source: Wiley InterScience Backfile Collection 1832-2000

Topics: Physics

Notes: A combination of the techniques of Rutherford backscattering spectrometry (RBS), secondary ion mass spectrometry (SIMS) and electrolyte electroreflectance (EER) have been used to profile through epitaxial layers and heterostrutures of CdxHg1 - xTe. The layers analysed by these techniques were grown either by photosensitized or thermal metal organic vapour phase epitaxy (MOVPE). The use of the EER technique, combined with electro-chemical etching, for depth profiling of layers is described. Good agreement between RBS and EER measurements of x has been achieved with a resolution of ±0.010 for RBS and ±0.002 for EER. A depth resolution of better than 50 Å has been achieved by all three of the techniques. SIMS has been used to profile for trace impurities in layers grown using the interdiffused multilayer process (IMP). Assessment of layer crystal quality using ion channelling and EER broadening parameter measurements is discussed. The advantages and disadvantages of each of the analysis techniques are discussed and compared.

Additional Material: 11 Ill.