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  • American Institute of Physics (AIP)  (22)
  • Springer Nature  (4)
  • 1985-1989  (25)
  • 1960-1964  (1)
  • 1
    Electronic Resource
    Electronic Resource
    Anomalous behavior of reverse leakage currents in liquid phase epitaxial HgCdTe photodiodes with 10 MeV electron irradiations (1988)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 52 (1988), S. 1614-1616 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have observed an anomalous behavior of reverse-bias leakage current in Hg1−xCdxTe n+-on-p photodiodes at 77 K as a function of total 10 MeV electron dose. For ZnS/SiO2 passivated planar configurations of photodiodes with 0.25〈x〈0.5, the leakage current increases superlinearly with increasing total dose greater than 10 krad, saturates at doses between 100 and 200 krad, followed by a dramatic recovery that is sometimes complete to near-preradiation values. For x(approximately-equal-to)0.2, very little or no recovery is observed. The effects of 60CO gamma irradiation are nearly identical.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.99057
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  • 2
    Electronic Resource
    Electronic Resource
    Contactless measurement of bulk free-carrier lifetime in cast polycrystalline silicon ingots (1986)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 60 (1986), S. 2008-2015 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The spatial dependence of the bulk free-carrier lifetime in cast polycrystalline silicon ingots was determined from contactless measurements of optically modulated free-carrier infrared absorption. Using a cw Nd: yttrium aluminum garnet (Nd:YAG) laser (λ=1.319 μm) for a probe and a novel pulsed tunable infrared dye laser (λ=1.10–1.13 μm), with photon energies near the Si band gap, for a pump, the free-carrier lifetime was determined from transient absorption measurements to a maximum depth of 3.0 cm from the surface of polycrystalline silicon ingots. Unmodulated infrared probe transmission measurements were used to monitor relative changes in the bulk precipitate density in ingots due to infrared scattering by the precipitates. Free-carrier lifetime profiles measured along the growth axis of polycrystalline silicon ingots had the same qualitative features as the minority carrier lifetime profile measured from n+p junction solar cells fabricated on the wafered ingots. Differences between the ingot-measured free-carrier lifetimes and the minority carrier lifetime, apparently due to high injection and possibly carrier trapping effects, are discussed.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.337202
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  • 3
    Electronic Resource
    Electronic Resource
    Preparation of TFTR diagnostics for D–T break-even experiments (1988)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 59 (1988), S. 1881-1883 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: Although diagnostic systems for the tokamak fusion test reactor (TFTR) must be compatible with high-power experiments in deuterium–tritium (D–T) plasmas, it has been neither possible nor desirable to implement all the required features during the early phases of the facility. The research plan, the physical plant, instrumentation, and diagnostic techniques have all evolved during the past decade, and some of the original plans are no longer suitable. Preparations are now underway for D–T operation in TFTR in 1990. Among the activities necessary in support of the research plan are completion of the installation of the D–T diagnostic set, modification of diagnostic hardware to accommodate the "igloo'' radiation shield of the torus, installation of auxiliary shielding for detectors and electronics, and enhancement of the reliability of specific components. These preparations and the final D–T diagnostic set for TFTR will be described.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1140041
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  • 4
    Electronic Resource
    Electronic Resource
    Parametric study of electron density profile evolution following injection in TFTR (1986)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 57 (1986), S. 1999-1999 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: Recent results from tokamak fusion test reactor (TFTR)1 pellet experiments have extended previous results to a larger volume and longer time scales. In this paper, the detailed study of electron density profile response following pellet injection is discussed. In particular, hollow density profiles with relatively long relaxation times (10–100 ms) from inverted gradients are obtained by injection of 2.67-mm-diam pellets, which penetrate to r(approximately-equal-to)a/2. Strongly peaked profiles [ne(0)/n¯e∼3] and central electron density ∼3.9×1020 m−3 are obtained by injection of three pellets, which penetrate to or beyond the magnetic axis. In both cases, the pellet mass is well accounted for by the measured density perturbation. This work was supported by U.S. DOE Contract No. DE-AC02-CHO-3073.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1138769
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  • 5
    Electronic Resource
    Electronic Resource
    Fast multichannel electron temperature diagnostic for TFTR using x-ray imaging (1985)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 56 (1985), S. 827-829 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The TFTR x-ray imaging system (XIS) is an array of 64-Si surface barrier diodes which image the plasma poloidally. Special absorber foils have been installed to permit measurement of electron temperature Te with 〈100-μs time resolution along 10–30 chords. The technique uses the ratio of x-ray fluxes transmitted through two different foils, which depend mainly on Te. Simulations show that strong line radiation can change this ratio. To correct for these effects, special beryllium–scandium filters are employed to select the line-free region between 2 and 4.5 keV. Separate filter pairs allow correction for strong L line radiation as well as Ti or Ni Kα emission. The Te determination is based on simulations. Comparison of results with Te values from the electron–cyclotron emission and x-ray pulse height analysis diagnostics is presented.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1138186
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  • 6
    Electronic Resource
    Electronic Resource
    Measurements of radial profiles of the ion temperature and the plasma rotation velocity with the TFTR vertical x-ray crystal spectrometer (abstract) (1988)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 59 (1988), S. 1852-1852 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The TFTR vertical x-ray crystal spectrometer has now been operating with three crystals and position-sensitive detectors according to the original design specifications. The observed spectra of heliumlike Ti xxi, Cr xxiii, Fe xxv, and Ni xxvii have permitted a detailed comparison with the predictions from atomic theories, and they have provided data on the radial profiles of the ion temperature and toroidal rotation velocity, as well as the radial ion charge-state distribution in TFTR discharges. Central ion temperatures of 20 keV and central plasma rotation velocities of 5×105 m/s have been recorded from plasmas with auxiliary neutral beam heating. These experimental results are presented. Also discussed are further instrumental improvements, such as the installation of two additional crystals and detectors and the installation of γ and neutron shielding, which will make it possible to measure under full DD and DT operation with 27 MW of neutral beam injection where neutron production rates of 1019 neutrons/s are expected.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1140086
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  • 7
    Electronic Resource
    Electronic Resource
    Measurements of Faraday rotation in TFTR plasmas (1986)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 57 (1986), S. 1994-1996 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: Recent results of simultaneous measurements of line electron density and poloidal field-induced Faraday rotation on the multichannel far infrared (FIR) interferometer/polarimeter on tokamak fusion test reactor (TFTR) are presented. The procedures and results of the calibration are described in detail. The effects of various errors in the measurement, as well as the problem of cross-coupling laser beams, are studied.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1138764
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  • 8
    Electronic Resource
    Electronic Resource
    Tokamak Fusion Test Reactor x-ray imaging diagnostic (1985)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 56 (1985), S. 830-832 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: An array of 64 silicon surface-barrier diodes on a circular arc view Tokamak Fusion Test Reactor (TFTR) plasmas through a slot aperture to provide poloidal imaging of x-ray emission in the 200 eV–15 keV range. Information is inferred on magnetohydrodynamic (MHD) instabilities, disruptions, radiation, impurity transport, electron temperature, and electron thermal conductivity. Spatial resolution is 2.5 cm. Movable absorber foil arrays provide energy selection. Preamplifier–amplifier pairs have gains of 0.05–100 V/μA. Two outputs are provided with (1) 40-, 80-, and 300-Hz and (2) 40-, 80-, and 600-kHz filtering. The signals are digitized at rates up to 500 kHz and stored in 128K (total system) memory. Foils, gains, and filters are selectable from the control room by a computer.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1138187
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  • 9
    Electronic Resource
    Electronic Resource
    Tokamak Fusion Test Reactor prototype x-ray pulse-height analyzer diagnostic (1985)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 56 (1985), S. 840-842 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The x-ray pulse-height analysis (PHA) diagnostic uses a liquid-nitrogen cooled array of 5 Si(Li) and one HpGe detectors to do time-resolved (5–100 ms) x-ray spectroscopy of the central horizontal chord of the Tokamak Fusion Test Reactor (TFTR) plasmas in the 1–50-keV range. Central electron temperature Te and concentration of medium and low-Z impurities are derived from the spectra. Remotely selectable absorber-foil arrays provide selection of the energy range. Fixed and movable aperture arrays allow approximate equalization of count rates in different energy bands and extend dynamic range. Amplifier pulse shapes are approximately triangular. Main amplifier peaking time is 4 μs yielding 230-eV FWHM at 5.9 keV. Pileup inspection times are selectable at 0.13, 0.4, or 0.9 μs. Throughput is up to 42 kHz. The PHA has been used to study temperature and impurities over a wide range of TFTR operational parameters. Dramatic variations in metal impurities with density, plasma current, and major radius have been observed.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1138517
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  • 10
    Electronic Resource
    Electronic Resource
    Tokamak Fusion Test Reactor horizontal high-resolution Bragg x-ray spectrometer (1985)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 56 (1985), S. 1165-1168 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A bent quartz-crystal spectrometer of the Johann type with a spectral resolution of λ/Δλ= 10000–25000 is used on the Tokamak Fusion Test Reactor (TFTR) to determine central plasma parameters from the spectra of helium-like and lithium-like metal impurity ions (Ti, Cr, Fe, and Ni). The spectra are observed along a central radial chord and are recorded by a position-sensitive multiwire proportional counter with a spatial resolution of 250 μ. Standard delay-line time-difference readout is employed. The data are histogrammed and stored in 64 K of memory providing 128 time groups of 512-channel spectra. The central ion temperature and the toroidal plasma rotation are inferred from the Doppler broadening and Doppler shift of the Kα lines. The central electron temperature, the distribution of ionization states, and dielectronic recombination rates are obtained from satellite-to-resonance line ratios. The performance of the spectrometer is demonstrated by measurements of the Ti xxi Kα radiation.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1138023
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