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  • Articles  (2)
  • Glucose repression  (1)
  • Polymer and Materials Science  (1)
  • General Chemistry
  • I21
  • Surface physics, nanoscale physics, low-dimensional systems
  • ddc:330
  • 1985-1989  (1)
  • 1965-1969  (1)
  • 1
    ISSN: 1617-4623
    Keywords: Glucose repression ; Glucose derepression ; Regulatory genes ; Expression analysis ; Saccharomyces cerevisiae
    Source: Springer Online Journal Archives 1860-2000
    Topics: Biology
    Notes: Summary Yeast strains carrying one of the two regulatory mutations cat1 and cat3 are defectve in derepression of several glucose-repressible enzymes that are necessary for utilizing non-fermentable carbon sources. Hence, these strains fail to grow on ethanol, glycerol or acetate. The synthesis of isocitrate lyase, malate synthase, malate dehydrogenase and fructose-1,6-bisphosphatase is strongly affected in cat1 and cat3 strains. Genes CAT1 and CAT3 have been isolated by complementation of the cognate, mutations after transformation with an episomal plasmid gene library. The restriction map of CAT1 proved its allelism to the earlier isolated SNF1 gene. Both genes appear to exist as single-copy genes per haploid genome as indicated by Southern hybridization. Northern analysis has shown that the 1.35 kb CAT3 mRNA is constitutively expressed, independent of the carbon source in the medium. Derepression studies with CAT3 transformants using a multi-copy plasmid showed over-expression of glyoxylate cycle enzymes. This result would be consistent with a direct effector function for the CAT3 gene product.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Weinheim [u.a.] : Wiley-Blackwell
    Materials and Corrosion/Werkstoffe und Korrosion 20 (1969), S. 183-194 
    ISSN: 0947-5117
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Description / Table of Contents: Investigations into the electrolytic-potentiostatic etching of stainless steels in 10 n NaOH, using a coulometerCurrent density/potential characteristics can only provide qualitative indications concerning the phenomena encountered with potentiostatic etching in 10 n NaOH. The process is best carried out in the trans-passive zone. Identification is based, not on the selective dissolution of certain standard components, but on the interference colours which can be observed as a result of the formation of cover layers of different thickness. The charge density/time characteristics also permit quantitative indications of the different phases. Current density/time curves permit a clarification of the mechanism govering the formation of cover layers. A ferritic steel (28 pC Cr) and a NiCr alloy (45 pC Cr) were found to follow a cubic law of growth, whilst CrNi steel 18-8 is initially governed by an approximately logarithmic law, followed by a zone extending over several hours where the growth begins to follow a parabolic law.
    Notes: Stromdichte-Potential-Kurven ermöglichen nur qualitative Aussagen über die Vorgänge beim potentiostatischen Ätzen in 10 n NaOH. Am günstigsten ist Ätzen im Transpassivbereich. Die Identifizierung erfolgt dabei nicht durch selektive Auflösung bestimmter Gefügebestandteile, sondern aufgrund der Interferenzfarben, die infolge der Bildung unterschiedlich starker Deckschichten zu beobachten sind. Die Ladungsdichte-Zeit-Kurven ermöglichen auch Aussagen über die Mengen der einzelnen Phasen. Stromdichte-Zeit-Kurven ermöglichen eine Aufklärung des Deckschichtbildungsmechanismus. Für einen ferritischen Stahl (28% Cr) und eine NiCr-Legierung mit 45% Cr gilt ein kubisches Wachstumsgesetz, während für CrNi-Stahl 18-8 zunächst ein annähernd logarithmisches Gesetz gilt, an das sich ein mehrstündiger Bereich anschließt, in dem übergang zu einem parabolischen Schichtwachstum erfolgt.
    Additional Material: 24 Ill.
    Type of Medium: Electronic Resource
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