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  • Chemistry  (5)
  • High-resolution electron microscopy  (1)
  • 1985-1989  (4)
  • 1970-1974  (2)
  • 1890-1899
  • 1
    Electronic Resource
    Electronic Resource
    New York, NY [u.a.] : Wiley-Blackwell
    Journal of Applied Polymer Science 18 (1974), S. 947-949 
    ISSN: 0021-8995
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Additional Material: 2 Ill.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    New York, NY [u.a.] : Wiley-Blackwell
    Biotechnology and Bioengineering 27 (1985), S. 434-438 
    ISSN: 0006-3592
    Keywords: Chemistry ; Biochemistry and Biotechnology
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Biology , Process Engineering, Biotechnology, Nutrition Technology
    Notes: An analysis of the radial flow cell is presented to show that the assumption of creeping laminar flow should be used cautiously. Simple models which account for the influence of fluid inertial forces over most of the width of the plate are reviewed. A modified Reynolds number is introduced which may be used to test the validity of the creeping flow solution.
    Additional Material: 4 Ill.
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  • 3
    Electronic Resource
    Electronic Resource
    New York, NY [u.a.] : Wiley-Blackwell
    Journal of Applied Polymer Science 18 (1974), S. 2261-2268 
    ISSN: 0021-8995
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: The spherulitic structure of films of fractionated bisphenol-A-polycarbonate having a range of different average molecular weight and molecular weight distribution has been studied using the polarization microscope. Spherulitic crystallization was induced in specimens by the action of solvent or solvent vapor at room temperature or by isothermal heat treatment at 180°C. These phenomena were all shown to be a function of the average molecular weight and polydispersity of the material. The glassy amorphous and spherulite polymer phases were investigated using a microscopic etching technique and gel permeation chromatography (GPC). Results of this investigation have established that considerable segregation by molecular weight occurs during the crystallization process. Spherulites produced have been shown to exhibit variation in morphologic texture depending on conditions of induction and polydispersity of the polymer. Examples of unusual and previously unreported spherulites have been observed.
    Additional Material: 5 Ill.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 14 (1989), S. 7-12 
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The Interfacial reactions between Al and RuO2, MoOx and WNx diffusion barriers on Si (100) wafers have been studied. The diffusion barrier structures were analyzed before and after various heat treatments using Auger electron spectroscopy (AES) and cross-sectional transmission electron microscopy (XTEM). Al was found to reduce the oxides of both Ru and Mo. A 100 Å thick Al2O3 layer developed between the Al and the RuO2 films during annealing at 500°C for 30 minutes. The formation of interfacial Al2O3 efficiently prevents Al penetration but may cause a too high contact resistance for applications in contact structures of microelectronic devices. The WNx barrier was stable after annealing at 600°C for 30 minutes, if the film was exposed to air prior to Al deposition. If, instead, the Al was deposited in situ, the structure failed after annealing at 500°C due to a reaction between Al and W giving WAl12. A thin Al2O3 layer was detected between the Al and the WNx films of the air exposed sample. This layer had the effect of retarding the Al-W reaction and thereby raised the failure temperature of the barrier by at least 100°C.
    Additional Material: 6 Ill.
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  • 5
    Electronic Resource
    Electronic Resource
    New York, NY : Wiley-Blackwell
    Journal of Electron Microscopy Technique 11 (1989), S. 310-325 
    ISSN: 0741-0581
    Keywords: High-resolution electron microscopy ; Radiation damage ; Phthalocyanines ; Life and Medical Sciences ; Cell & Developmental Biology
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Natural Sciences in General
    Notes: The history of high-resolution imaging of organic crystals is summarized, followed by a discussion of radiation damage which reflects current thinking. Methods of specimen preparation and the experimental techniques for high-resolution imaging are described. The results show the application of these techniques to aromatic hydrocarbons, phthalocyanines, and linear-chain aliphatic molecules. Artefacts and image interpretation are also discussed.
    Additional Material: 16 Ill.
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  • 6
    Electronic Resource
    Electronic Resource
    Weinheim : Wiley-Blackwell
    Propellants, Explosives, Pyrotechnics 10 (1985), S. 61-64 
    ISSN: 0721-3115
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology , Process Engineering, Biotechnology, Nutrition Technology
    Notes: Scanning electron microscopy (SEM) and X-ray photoelectron spectroscopy (XPS) have been used to examine the nature and quality of wax-coated RDX crystals. SEM allows a visual assessment of wax-coated crystals and comparison of different coating processes. XPS has allowed a semiquantitative determination of the degree of wax coverage by measurement of the carbon to nitrogen photoelectron emissions and calculation of the percentage of wax coverage using a simple mathematical treatment.
    Additional Material: 7 Ill.
    Type of Medium: Electronic Resource
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