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  • ELECTRONICS AND ELECTRICAL ENGINEERING  (2)
  • 1985-1989  (1)
  • 1980-1984  (1)
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  • 1
    Publication Date: 2011-08-19
    Description: Charges on the surface of fluorinated-ethylene-propylene affect its secondary electron emission coefficient. Measurements with impact energies exceeding that energy which causes peak emission have been made in regions where the local electric field produced by the surface charge is normal to the surface and in regions where it is oblique. The surface of the 6-mm wide specimen was charged to either 6 or 10 kV. Because the impinging primary beam was deflected by the charged specimen, numerical modeling was used to predict the beam's impact energy E, impact angle theta, and the impact point. The formula predicts the coefficient in the region of normal field up to 60 deg although E(0) depends upon the electric field and also on the history of the specimen. Near the edges where the field is oblique, the measured coefficient departs significantly from what the formula predicts.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: IEEE Transactions on Electrical Insulation (ISSN 0018-9367); EI-20; 485-491
    Format: text
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  • 2
    Publication Date: 2019-07-13
    Description: Methods for measuring electrostatic potentials on and near dielectric surfaces charged to several kilovolts are studied. Secondary emission from those charged dielectrics is measured. Candidates for potential measurement include the induced charge, from which potential is calculated; the trajectory endpoints of either high or low energy particles traversing the region near the surface; trajectory impact on the surface; and creating ions at points of interest near the surface. Some of the methods require computer simulations and iterative calculation if potential maps are to be generated. Several approaches are described and compared. A method using a half-cylinder as a test chamber and low-energy probing beams is adapted for the measurement of seconary emission.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA-CR-168556
    Format: application/pdf
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