ISSN:
1618-2650
Source:
Springer Online Journal Archives 1860-2000
Topics:
Chemistry and Pharmacology
Notes:
Summary The rapid progress in high technology constantly poses new challenges for Analytical Chemistry and prompts the development of new techniques and procedures. The influence is particularly strong in surface and interface analysis, which is developing at a rapid pace. This paper discusses some of the frontier areas like high-resolution depth-distribution analysis of trace elements, quantitative depth distribution analysis of ultra thin-layer systems, quantitative trace element analysis in monolayers, 3-dimensional stereometric analysis, molecular analysis, in-situ atomic resolution analysis of surfaces (chemical nanoscopy). Methodological approaches are discussed as well as results obtained mainly with solid state mass spectrometry and atomic force microscopy.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF00321252
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