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  • ELECTRONICS AND ELECTRICAL ENGINEERING  (4)
  • OPTICS  (3)
  • 1990-1994  (7)
  • 1
    Publication Date: 2013-08-31
    Description: A 100 Mbit/s FDDI (fiber distributed data interface) network interface unit is described that supports real-time data, voice and video. Its high-speed interrupt-driven hardware architecture efficiently manages stream and packet data transfer to the FDDI network. Other enhancements include modular single-mode laser-diode fiber optic links to maximize node spacing, optic bypass switches for increased fault tolerance, and a hardware performance monitor to gather real-time network diagnostics.
    Keywords: OPTICS
    Type: NASA, Washington, Technology 2000, Volume 2; p 268-275
    Format: application/pdf
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  • 2
    Publication Date: 2019-06-28
    Description: An oven assembly design is described, which will be used to determine the effects of temperature on the electrical properties of materials which are used as coatings for metal plates. Experimentally, these plates will be heated to a very high temperature in the oven assembly, and measured using a microwave reflectance measurement system developed for the NASA Lewis Research Center, Near-Field Facility. One unknown in this measurement is the effect that the oven assembly will have on the reflectance properties of the plate. Since the oven will be much larger than the plate, the effect could potentially be significant as the size of the plate becomes smaller. Therefore, it is necessary to predict the effect of the oven on the measurement of the plate. A method for predicting the oven effect is described, and the theoretical oven effect is compared to experimental results of the oven material. The computer code which is used to predict the oven effect is also described.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA-CR-187140 , E-6272 , NAS 1.26:187140
    Format: application/pdf
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  • 3
    Publication Date: 2019-06-28
    Description: An improved AOTF-based imaging spectrometer that offers several advantages over prior art AOTF imaging spectrometers is presented. The ability to electronically set the bandpass wavelength provides observational flexibility. Various improvements in optical architecture provide simplified magnification variability, improved image resolution and light throughput efficiency and reduced sensitivity to ambient light. Two embodiments of the invention are: (1) operation in the visible/near-infrared domain of wavelength range 0.48 to 0.76 microns; and (2) infrared configuration which operates in the wavelength range of 1.2 to 2.5 microns.
    Keywords: OPTICS
    Format: application/pdf
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  • 4
    Publication Date: 2019-06-28
    Description: A recent effort at the NASA Lewis Research Center (LeRC), Microwave System Laboratory was to develop the capability to perform farfield reflectance measurements. This effort has resulted, to date, in a system that can perform X-band, monostatic, measurements of test objects. The system and the measurement procedure are described. Data are presented which assists in the evaluation of the quality of the measurements obtained with the system.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA-CR-187063 , E-5985 , NAS 1.26:187063
    Format: application/pdf
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  • 5
    Publication Date: 2019-06-28
    Description: A corrugated horn was designed and fabricated for use as a feed for the half-scale accurate antenna reflector. This feed allows the reflector to be used in a compact range configuration as part of a microwave reflectance measuring system. The horn design is described, and the measured farfield patterns of the horn are presented. The horn was installed at the focus of the reflector, and the nearfield of the antenna was measured. The results of these measurements are presented and discussed with respect to the compact range application.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA-CR-187047 , E-5886 , NAS 1.26:187047
    Format: application/pdf
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  • 6
    Publication Date: 2019-06-28
    Description: A simulation is described of a proposed microwave reflectance measurement in which the half scale reflector is used in a compact range type of application. The simulation is used to determine an acceptable aperture taper for the reflector which will allow for accurate measurements. Information on the taper is used in the design of a feed for the reflector.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA-CR-185215 , E-5373 , NAS 1.26:185215
    Format: application/pdf
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  • 7
    Publication Date: 2019-08-17
    Description: An acousto-optic tunable filter (AOTF) is employed to generate a display by driving the AOTF with a RF electrical signal comprising modulated red, green, and blue video scan line signals and scanning the AOTF with a linearly polarized, pulsed light beam, resulting in encoding of color video columns (scan lines) of an input video image into vertical columns of the AOTF output beam. The AOTF is illuminated periodically as each acoustically-encoded scan line fills the cell aperture of the AOTF. A polarizing beam splitter removes the unused first order beam component of the AOTF output and, if desired, overlays a real world scene on the output plane. Resolutions as high as 30,000 lines are possible, providing holographic display capability.
    Keywords: OPTICS
    Type: NAS 1.71:NPO-18736-1-CU
    Format: text
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