Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Journal of Applied Physics
69 (1991), S. 8298-8303
ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
Photoreflectance line shapes of various semiconductor microstructures were discussed in this paper. Formulas suitable for application in low-dimensional structures were given and used to analyze experimental results from various semiconductor microstructures including GaAs nipi structures, GaAs/AlGaAs multiple quantum wells, InGaAs/GaAs strained-layer superlattices, and
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.347439
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