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  • 1
    Electronic Resource
    Electronic Resource
    Springer
    Journal of electronic testing 4 (1993), S. 215-224 
    ISSN: 1573-0727
    Keywords: Constant tetability ; fault detection ; fault location ; FFT ; testing
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: Abstract This article presents new approaches for testing VLSI array architectures used in the computation of the complexN-point Fast Fourier Transform. Initially, an unrestricted single cell-level fault model is considered. The first proposed approach is based on a process whose complexity is independent (or C- as constant) of the number of cells in the FFT architecture. This is accomplished by showing a topological equivalence between the FFT array and a linear (one-dimensional) array. The process of fault location is also analyzed. The second proposed method is based on a testing process whose complexity is linear with respect to the number of stages (columns) of the FFT array. A component-level fault model is also proposed and analyzed. The implications of this model on the C-testability process are fully described.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Springer
    Journal of electronic testing 3 (1992), S. 139-148 
    ISSN: 1573-0727
    Keywords: Constant testability ; design for testability ; finite automata ; testing ; tree structures
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: Abstract This paper presents various approaches for testing cellular tree structures with a constant number of test vectors, that is, independent of the number of cells (size of the tree). The necessary and sufficient conditions which must be satisfied in the state table of a basic combinational cell for achieving C-testability and one-step C-testability in a homogeneous tree, are proved. The design modifications required to accomplish this objective in arbitrary cells, are discussed. It is proved that three additional rows and three additional columns are needed in the state table of a cell; the characteristics of the additional states are also analyzed. The complexity of the proposed testing process is quadratic with respect to the number of entries in the state table of a cell. Illustrative examples are also given.
    Type of Medium: Electronic Resource
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