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  • American Institute of Physics (AIP)  (2)
  • EDP Sciences
  • Hindawi
  • 1990-1994  (2)
  • 1
    Electronic Resource
    Electronic Resource
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 96 (1992), S. 1854-1857 
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: A new technique has been developed for the measurement of the translational energy of molecules in single rovibrational quantum states. Molecules from a given rotation–vibration level are excited to a long-lived electronic state by a pulsed, tunable ultraviolet (UV) laser and are allowed to collide with the surface of a low work function metal. Since the energy of the metastable state exceeds that of the metal's work function, collisions result in the ejection of electrons from the metal surface, which may be detected with high efficiency. This technique has been applied successfully to the carbon monoxide system, where measurements of molecular beam velocities and extremely weak forbidden electronic transitions have been made. The detection efficiency of this technique is estimated to be 2.0×10−4, comparable with electron impact ionization and mass-selected detection. Possible future applications of the technique in spectroscopy, photodissociation, and photon stimulated desorption experiments are discussed.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 65 (1994), S. 3078-3080 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The epitaxial growth of fcc Mn films on the GaAs(001) surface has been achieved. The films are studied by in situ reflection high energy electron diffraction (RHEED) and ex situ x-ray diffraction (XRD). The lattice parameters of the metastable Mn films are determined to be 0.362 nm. A transition region composed of a Mn-Ga-As alloy is formed at the Mn/GaAs interfaces and is clearly verified by XRD measurements. © 1994 American Institute of Physics.
    Type of Medium: Electronic Resource
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