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  • 1995-1999  (2)
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  • 1
    Electronic Resource
    Electronic Resource
    Fast algorithms for selection of test nodes of an analog circuit using a generalized fault dictionary approach (1995)
    Springer
    Circuits, systems and signal processing 14 (1995), S. 707-724 
    Details
    ISSN: 1531-5878
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: Abstract Selection of test nodes is an important phase of the fault dictionary approach. It is demonstrated in this paper that the techniques used for this purpose in other approaches of analog fault diagnosis like fault analysis and fault verification are not in general suitable for the fault dictionary approach. The ambiguity set is a simple and effective concept for choosing test nodes in the context of dictionaries. These sets are formed such that each faulty condition lies in only one ambiguity set. Deviating from this thinking, overlapping ambiguity sets are proposed in this paper, giving rise to a generalized fault dictionary. These sets use information more fully and hence reduce the number of test nodes. The concept of hashing is applied in this paper for selecting test nodes. This gives a linear time algorithm (linear in the number of fault voltage specificationsf′) and it isf′ times faster than the existing methods. It is not possible to select test nodes faster than this. This technique can also be used to select test nodes by the process of elimination of nodes. This is also linear inf′ per node elimination. Even a group of nodes can be eliminated or selected within the same computation. This freedom is not possible with the existing methods.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF01204680
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    On minimal set of test nodes for fault dictionary of analog circuit fault diagnosis (1995)
    Springer
    Journal of electronic testing 7 (1995), S. 255-258 
    Details
    ISSN: 1573-0727
    Keywords: analog circuits ; fault dictionary ; test nodes
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: Abstract A method is proposed to obtain a minimal set of test nodes of an analog circuit for isolating all faulty conditions in the fault dictionary approach. Relevant theorem along with the proof is also given. Proposed method is extremely fast. This method is illustrated with an active filter circuit example.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00995317
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    Paper (German National Licenses)
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